Analysis of a national inter-laboratory comparisonof high dc resistance at 10 MΩ and 1 GΩ level

• Autorzy: Galliana F. , Capra P.
• Języki publikacji: EN

Abstrakty

EN

A national comparison of dc resistance at 10 MΩ and 1GΩ level was organized by the Electromagnetic Division of National Institute of Metrological Research (INRIM, Italy) and piloted by the same Division. This comparison took place between January and April of 2008 with the participation of 8 secondary Laboratories accredited by the Italian Accreditation of Calibration Laboratories Service (SIT). The travelling package included a wire-wound 10 MΩ standard and a thick film-type 1 GΩ standard in a wooden anti-shock container designed by INRIM. The obtained results indicate that the differences at 10 MΩ and 1 GΩ between each laboratory's value and its reference value are all within the expanded relative uncertainties of these differences.

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 3
• Strony: 377--389
• Opis fizyczny: Bibliogr. 6 poz., rys., tab., wykr.

Twórcy

autor

Galliana F.

autor

Capra P.

• National Institute of Metrological Research, (INRM) str. delle Cacce, 91 - 10135, Turin, Italy,

Bibliografia

• [1] ISO/IEC CD 17043 “Conformity assessment - General requirements for proficiency testing” CASCO 05/2008, draft edition, 2008-03-14 previously ISO/IEC Guide 43-2:1997.
• [2] EA-2/10. EA Policy for Participation in National and International Proficiency Testing Activities, rev.0, August 2001.
• [3] F. Galliana, P.P. Capra: “A temperature, humidity and pressure independent 1 GΩ standard resistor: realization and preliminary results”. Proc. of the 12th IMEKO TC-4 Int. Symp. on Electrical Meas. Instrum., 25-27 September 2002, pp. 25-28.
• [4] F. Galliana, P.P. Capra, E. Gasparotto: “Metrological management of the high dc resistance scale at INRIM”. Measurement, no. 42, 2009, pp. 314-321.
• [5] BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML: Guide to the expression of uncertainty in measurement, First edition, 1993, ISBN 92-67-10188-9.
• [6] R.F. Dziuba, D.G. Jarrett: “Final report on key comparison CCEM-K2 of resistance standards at 10 MΩ and 1 GΩ”. Metrologia, 39, 01001, doi:10.1088/0026-1394/39/1A/1.