A temperature variable high accuracy 10 kΩ resistor

• Autorzy: Capra P. P. , Cassiago C. , Galliana F. , Astrua M.
• Języki publikacji: EN

Abstrakty

EN

A temperature-variable high accuracy (TVHAR) 10 kΩ resistor has been developed at the National Institute of Metrological Research, (INRIM), in order to transfer the traceability to high accuracy multifunction instruments used in the accredited calibration laboratories. The TVHAR consists of ten 100 kΩ nominal value resistors inserted in a copper block and connected in a parallel configuration. The thermal stability of the copper block is obtained with a temperature controller. In this paper details of the development of the TVHAR and of its thermal behaviour are reported. From preliminary results its relative short-time stability (2h) is on the order of a few parts in 10-8, a negligible temperature coefficient around 23°C and a power coefficient on the order of -4×10-6/W.

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 1
• Strony: 183--191
• Opis fizyczny: Bibliogr. 6 poz., fot., rys., wykr.

Twórcy

autor

Capra P. P.

autor

Cassiago C.

autor

Galliana F.

autor

Astrua M.

• National Institute of Metrological Research, str. delle Cacce, 91 - 10135 Turrin, Italy,

Bibliografia

• [1] Calibration: Philosophy in Practice. Fluke Corporation, Second Edition.
• [2] G. Rietveld: “Artifact calibration - The role of software in metrology”. NCSL Workshop and Symposium, 1996.
• [3] G. Rietveld: Artifact calibration: An evaluation of the Fluke 5700A series II calibrator. Rep. ISBN 90-91322-4, Nov. 1999.
• [4] A.C. Grossenbacher: “Development of a precision one ohm resistance standard”. Prec. Electr. Meas. Digest, Conference, October 1998, pp. 520-521.
• [5] A.F. Dunn: “Increased Accuracy for Resistance Measurements”. IEEE Trans. Meas., vol. IM-15, no. 4, pp. 220-226, December 1966.
• [6] G. Boella, P.P. Capra, C. Cassiago, R. Cerri, G. Marullo Reedtz, A. Sosso: “Traceability of the 10-k Standard at IEN”. IEEE Trans. Meas., vol. 50, no. 2, April 2001, pp. 245-248.