Methods for economical test of dynamic parameters ADCs

• Autorzy: Vedral J. , Fexa P. , Svatoš J.
• Języki publikacji: EN

Abstrakty

EN

This paper describes two methods for economical test of dynamic parameters ADCs. First method is Exponential Fit Test, second method is Wobbler Test. Common testing methods are mentioned as far the accuracy and time necessary for the complete test are concerned. The tests for fast evaluation of the dependence of an effective number of bits on frequency of input signal are described and the comparison of proposed method with the standard methods is given. The suitable area of proposed method application is "each-piece" factory testing requiring extremely short time testing.

Słowa kluczowe

EN

ADC Test; Exponentional Fit Test; Wobbler Test; Effective Number of Bits

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 1
• Strony: 161--170
• Opis fizyczny: Bibliogr. 9 poz., rys., tab., wykr.

Twórcy

autor

Vedral J.

autor

Fexa P.

autor

Svatoš J.

• Czech Technical University in Prague, Faculty of Electrical Engineering, Department of Measurements, Technicka 2, CZ 16627, Prague 6, Czech Republic,

Bibliografia

• [1] IEEE Standard 1057-1994, IEEE Standard for Digitizing Waveform Recorders.
• [2] IEEE Standard 1241 - 2000, IEEE Standard and Teminology and Test Methods for Analog-to-Digital Converters.
• [3] J. Holub, R. Šmíd, J. Vedral: “Chirp Based Method for ADC Testing: Simulation and Evaluation”. Advanced A/D and D/A Conversion Techniques and Their Applications. Glasgow, University of Strathclyde, 1999, pp. 94-96.
• [4] R. Holcer, L. Michaeli: “DNL ADC Testing by the exponential shaped voltage”. IEEE Transaction on Instrumentation and Measurement, vol. 52, no. 3, 2003, pp. 946-949.
• [5] Cyclone II FPGA Starter Development Kit, http://www.altera.com
• [6] J. Holub, J. Něskudla, J. Vedral: “Measurements of ADCs Effective Resolution”. The 5th IEE International Conference on Advanced A/D and D/A Conversion Techniques and thein Applications. Limerick, The IEE Measurement, Sensors, Instrumentation and Professional Network, 2005, pp. 255-257.
• [7] J. Vedral, J. Něskudla: “Quality Testing of 24 Bit Audio Codecs”. Electronic Devices and Systems - IMAPS CS International Conference 2006. VTU Brno 2006, p. 125-130.
• [8] J. Vedral: “Exponential Fit Test - Theoretical Analysis and Practically Implementation”. 13th Workshop on ADC Modelling and Testing, Florence, University of Florence, 2008, p.1033-1036. CD-ROM.
• [9] J. Vedral: “Implementation of ADC Wobbler Test in FPGA”. DCIS 2008 - Conference on Design of Circuits and Integrated Systems, Grenoble, TIMA, 2008. CD-ROM.