Analog circuits diagnosis using discrete wavelet transform of supply current

• Autorzy: Kuczyński A. , Ossowski M.
• Języki publikacji: EN

Abstrakty

EN

A discrete wavelet transform based dynamic supply current analysis technique for detecting the catastrophic faults in analog circuits containing transistor is investigated in the paper. Some considerations due to a problem of fault localization using multiresolution approximation and the illustrative numerical example are presented.

Słowa kluczowe

EN

fault diagnosis; fault detection and localization; electronic circuits; discrete wavelet transform; multiresolution signal approximation

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 1
• Strony: 77--84
• Opis fizyczny: Bibliogr. 10 poz., rys., tab., wykr.

Twórcy

autor

Kuczyński A.

autor

Ossowski M.

• Technical University of Lodz, Institute of Theoretical Electronics, Metrology and Material Science, Stefanowskiego 18/22, 90-924 Łódź, Poland,

Bibliografia

• [1] I. Baturone, J. Lhuertas, S. Sanchez Solano, A.M. Richardson: “Testing Analog Circuits by Supply Voltage and Supply Current Monitoring”. Proc. IEEE Customs Integrated Ciecuit Conference, 1999, pp.155-158.
• [2] B. Vinnakota: “Monitoring Power Dissipation for Fault Detection”. Journal of Electric Testing,: Theory and Application 11, pp.173-181.
• [3] G. Gilen, Z. Wang, W. Sansen: “Fault Detection and Input Stimulus Determination for the Testing of Analog Integrated Circuits Based on Power Supply Current Monitoring”. IEEE/ACM International Conference on CAD, 1994, pp.495-499.
• [4] S. Bhunia, K. Roy: “A Novel Wvelet Transorrm-Based Transient Current Analysis for Fault Detection and Localization”. IEEE Transactions on VLSI Systems, vol. 13, no.4, April 2005, pp. 503-507.
• [5] J. Frenzel, P. Marinos: “Power supply Current Signature (PSCS) Analysis: A New Approach to System Testing”. International Test Conference, 1987, pp. 125-135.
• [6] A. Kuczyński, M. Ossowski: “Wavelet Analysis for Defect Oriented Testing of Analog Circuits Containing Bipolar Transistors”. Proceedings of the International Conference on Signals and Electronic Systems, September 2006, pp. 557-560.
• [7] A. Kuczyński, M. Ossowski: “Poprawa skuteczności wykrywania uszkodzeń katastroficznych w układach analogowych”. Elektronika. Konstrukcje. Technologie. Zastosowania, no.11/2007, pp. 108-110. (in Polish).
• [8] A. Graps: “An Introduction to Wavelets”. IEEE Computational Science and Engineeing, vol. 2, no. 2, Summer 1995.
• [9] J.T. Białasiewicz: Falki i aproksymacje, Wydawnictwa Naukowo-Techniczne, Warszawa, 2000. (in Polish).
• [10] M. Misiti, Y. Misiti, G. Oppenheim, J-M. Poggi: Wavelet Toolbox User’s Guid.