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Soft Fault Diagnosis in Analog Circuit Based on Fuzzy and Direction Vector

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
A basic circuit theory of fault diagnosis for analog circuits with parameter tolerance is proposed in this paper. The approach uses the direction vector of voltage increment in test nodes as a fault signature for predefined faults. A linear equation is built to locate a faulty element. On the condition that the component tolerances are taken into account, the concepts of direction vector and fuzzy analysis method are combined together to analyze a parametric fault. Examples illustrate the proposed approach and show its effectiveness.
Słowa kluczowe
Rocznik
Strony
61--75
Opis fizyczny
Bibliogr. 25 poz., rys., tab.
Twórcy
autor
autor
autor
autor
  • University of Electronic Science and Technology of China, The School of Automation Engineering, Chengdu 610054, China, zhoulf_1977@163.com
Bibliografia
  • [1] Semiconductor Industry Technology Workshop Conclusions, 1993, Semiconductor Industry Association.
  • [2] European Design and Test Conference Conclusions, March 1996.
  • [3] Ruey-Wen Liu, V. Visvanathan: “Sequentially Linear Fault Diagnosis: Part I-Theory”. IEEE Trans. Circuits Sys, vol 26,(7), 1979, pp.490-495.
  • [4] J.W. Bandler, A.E. Salama: “Fault diagnosis of analog circuits”. Proceedings of the IEEE, vol.73, (8), 1985, pp. 1279-1325.
  • [5] C.S. Lin, Z.F. Huang, R.W. Liu: “Fault diagnosis of linear analog networks: a theory and its implementation”, Proc. IEEE Int. Symp. Circuits and Systems (Newport Beach. CA), 1983, pp.1090-1093.
  • [6] Z.F. Huang, C.S. Lin, R.W. Liu: “Node-fault Diagnosis and a Design of Testability”. IEEE Trans. Circuits Sys, vol. 30, 1983, pp.257-265.
  • [7] P.M. Lin, Y.S. Eloherif: “Analog circuits fault dictionary–new approaches and implementation”. Int. J. Circuit Theory Appl., vol. 13(2), 1985, pp.149-172.
  • [8] N. Nagi, A. Chatterjee, A. Balivada, J.A. Abraham: “Fault-based automatic test generator for linear analog devices”. International Conference on Computer Aided Design, 1993, pp. 88-91.
  • [9] G. Devarayanadurg, M. Soma: “Analytical fault modeling and static test generation for analog ICs”. International Conference on Computer Aided Design, 1994, pp. 44-47.
  • [10] M. Salamani, M. Kaminska, B. Quesnel G.: “An integrated approach for analog circuit testing with minimum number of detected parameters””. International Test Conference, 1994, pp. 631-640.
  • [11] M. Salamani, B. Kaminska: “”Multifrequency analysis of faults in analog circuits”. IEEE Design & Test of Computers, Summer 1995, pp. 70-80.
  • [12] E. Abderrahman Cerny, B. Kaminska: “CLP-based multifrequency test generation for analog circuits”. VLSI Test Symposium, 1997, pp. 158-165.
  • [13] L. Feng, Peng-Yung Woo: “The Invariance of Node-Voltage Sensitivity Sequence and Its Application in a Unified Fault Detection Dictionary Method”. IEEE Trans .Circuits Sys. I, vol. 46, 1999, pp. 1222-1227.
  • [14] M. Tadeusiewicz, M. Korzybski: “A method for fault diagnosis in linear electronic circuits”. Int. J. Circuit Theory Appl., vol. 28(3), 2000, pp. 245-262.
  • [15] M. Tadeusiewicz, S. Halgas, M. Korzybski: “An Algorithm for Soft-Fault Diagnosis of Linear and Nonlinear Circuits”. IEEE Trans. Circuits Sys. I, vol. 49, 2002, pp. 1648-1653.
  • [16] P.Wang, S. Yang: “A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-Signal Circuits by Using Fuzzy Math”. IEEE Trans .Circuits Sys. I, vol. 52(10), 2005, pp. 2118-2127.
  • [17] M. Catelani, A. Fort: “Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Network”. IEEE Transaction on Instrumentation and Measurements, vol. 51, no. 2, April 2002, pp. 196-202.
  • [18] C. Alippi, M. Catelani, A. Fort, M. Mugnaini: “”SBT Soft Fault Diagnosis in Analog Electronic Circuits: a Sensitivity-Based Approach By Randomized Algorithms”. IEEE Transaction on Instrumentation and Measurements, vol. 51(5), 2002, pp. 1116-1125.
  • [19] C. Alippi, M. Catelani, A. Fort: “Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits”. IEEE Transaction on Instrumentation and Measurement, vol. 54, no. 3, June 2005, pp. 1033-1044.
  • [20] L.A. Zadeh, etc: “Fuzzy Sets and Their Applications to Cognition and Decision Processes”. IEEE Transactions on Systems, Man and Cybernetics, vol. 7(2), February 1977, pp. 122-123.
  • [21] P. Zuzeng, S. Yunyu: Fuzzy Math and Application. Wuhan, China, Wuhan University Press, 2002.
  • [22] H. Lee, Kwang: First Course on Fuzzy Theory and Application. Springer, 2005.
  • [23] PSpice User’s Guide. http://www.OrCAD.com.
  • [24] Cadence Inc. OrCAD/PSpice User’s Guide. 2000.
  • [25] B. Kaminska, K. Arabi, I. Bell, etc: “Analog and Mixed-Signal Benchmark Circuits - First Release”. IEEE International Test Conference, 1997, pp. 183-190.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BSW1-0054-0005
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