Built-in test scheme for detection, classification and evaluation of nonlinearities

• Autorzy: Toczek W. , Kowalewski M.
• Języki publikacji: EN

Abstrakty

EN

This paper presents a Built-In Test (BIT) scheme intended for detection of nonlinearities, classification of the form of nonlinearity and evaluation of the total harmonic distortion (THD) of the signal under test, without using expensive automatic test equipment (ATE). The tester is based on a sigma-delta modulator located on a board and artificial neural networks implemented in an attached personal computer. The proposition is verified by simulation in a Matlab/Simulink environment for three classes of nonlinearities - clipping effect, crossover distortion and rate limiting. The model of the Van der Pol oscillator is used as a programmable reference source of nonlinear oscillation.

Słowa kluczowe

EN

built-in test; oscillation-based test; evaluation of nonlinearities; sigma-delta modulator; neural networks

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 1
• Strony: 47--59
• Opis fizyczny: Bibliogr. 16 poz., rys., tab., wykr.

Twórcy

autor

Toczek W.

autor

Kowalewski M.

• Gdansk University of Technology, Faculty of Electronics Telecommunication and Informatics, Gabriela Narutowicza 11/12, 80-952 Gdańsk, Poland,

Bibliografia

• [1] J.L. Huertas: Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, Boston, 2004.
• [2] K. Arabi, B. Kaminska: “Oscillation-Test Methodology for Low-Cost Testing of Active analog Filters”. IEEE Transactions on Instrumentation and Measurement, vol. 48, no. 4, 1999, pp. 798-806.
• [3] D. Vazquez, G. Huertas, G. Leger, E. Peralias, A. Rueda, J.L. Huertas: “On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched - Capacitors Circuits”. Analog Integrated Circuits and Signal Processing, vol. 33, 2002, pp 201-211.
• [4] S. Saine, J. Raczkowycz, P. Mather: “An analogue test response compaction technique using delta-sigma modulation”. Microelectronics Journal, vol. 32, 2001, pp. 339-50.
• [5] W. Toczek: “Analog fault signature based on sigma-delta modulation and oscillation-test methodology”. Metrology and Measurement Systems, vol. XI, 2004, pp. 363-375.
• [6] H.C. Hong, J.L. Huang, K.T. Cheng, C.W. Wu: “On-chip Analog response Extraction with 1-bit Σ-Δ Modulators”. Proceedings of the 11-th Asian Test Symposium, 2002, pp. 1-6.
• [7] K.J. Lee, S.J. Chang, R.S. Tzeng: “A Sigma-Delta Modulation Based BIST Scheme for A/D Converters”. Proceedings of the 12-th Asian Test Symposium 2003, pp. 1-4.
• [8] H.C. Hong, C.W. Wu, K.T. Cheng: “A ΣΔ Modulation Based Analog BIST System with a Wide Bandwidth Fifth-Order Analog Response Extraction for Diagnosis Purpose”. Proc. of the 13th Asian Test Symposium, 2004.
• [9] D. Vazquez, G. Leger, G. Huertas, A. Rueda, J.L. Huertas: “A method for Parameter extraction of Analog Sine-wave Signals for Mixed-Signal Built-In-Self-Test Applications”. Proc. of the Design, Automation and Test in Europe Conference (DATE’04), 2004, pp. 1-6.
• [10] B. Dufort, G.W. Roberts: “On-chip Analog Signal Generation for Mixed-Signal Built-In Self-Test”. IEEE Journal of Solid-State Circuits, vol. 34, no. 3, 1999, pp. 318-330.
• [11] M.F. Toner, G.W. Roberts: “On the Practical Implementation of Mixed Analog-Digital BIST”. IEEE Custom Integrated Circuits Conference, Santa Clara, California, May 1995, pp. 525-528.
• [12] R.J. Baker: CMOS mixed-signal circuit design, Wiley-Interscience, 2002.
• [13] R. Schreier, G.C. Temes: Understanding Delta-Sigma Data Converters, Wiley-Interscience, New Jersey, 2005.
• [14] G. Yin, W. Sansen: “A High-Frequency and High-Resolution Fourth-Order ΣΔ A/D Converter in BiCMOS Technology”. IEEE Journal of Solid-State Circuits, vol. 29, no. 8, 1994, pp. 857-865.
• [15] A.K. Lu, G.W. Roberts: “An analog multi-tone signal generator for built-in-self-test applications”. IEEE Int. Test Conference, Baltimore, 1994, pp. 1-10.
• [16] A.H. Nayfeh, D.T. Mook: Nonlinear oscillations, John Wiley & Sons, 1995.