Advanced Nanometrology Techniques of Carbon Nanotubes Characterization

• Autorzy: Ali S. H. R. , Etman M. A. , Azzam B. S. , Rashad R. M. , Bedewy M. K.
• Języki publikacji: EN

Abstrakty

EN

It has become evident that carbon nanotubes (CNTs) possess exceptionally high physical, mechanical, electrical, and structural properties that made them attractive for researchers to investigate. In this paper, CNTs synthesized by submerged DC arc in deionized water were subjected to six different characterization techniques in order to have an insight into their intrinsic properties. Stages of CNTs growth scenario during their synthesis were captured by Transmission Electron Microscopy (TEM). Images of Scanning Tunneling Microscopy (STM) depicted the spaghetti-like nature of nanotubes sized in the range from 6 to 8 nm diameters with bends and kinks observed. Transmission Electron Diffraction Microscopy (TEDM) images declared the purity of the synthesized CNTs. Also, Fourier Transformation Infra Red (FTIR) spectrum analysis depicted the transmittance and frequency band widths of peaks relevant to the functional groups. In addition, Raman spectrum analysis disclosed the G and D modes with no radial breathing mode (RBM) for a random sample of the synthesized CNTs indicating some defects, strain, oxidation stated of the SWCNTs with the possibility of multiwalled carbon nanotubes existence as well. Thermo Gravimetric Analysis (TGA) reflected the thermal stability of the synthesized CNTs as they sustained temperatures approaching almost 1000°C. Thus, it can be concluded that the used techniques proved to successfully characterize the synthesized CNTs, so that they can be reasonably nominated for suitable potential application.

Słowa kluczowe

EN

nanometrology; CNTs characterization; STM; TEM; TEDM; FTIR; Raman spectroscopy; TGA

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2008
• Tom: Vol. 15, nr 4
• Strony: 551--561
• Opis fizyczny: Bibliogr. 23 poz., rys., tab., wykr.

Twórcy

autor

Ali S. H. R.

autor

Etman M. A.

autor

Azzam B. S.

autor

Rashad R. M.

autor

Bedewy M. K.

• Engineering and Surface Metrology, National Institute of Standards, Egypt,

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