Several approaches to ADC transfer function approximation and their application for ADC non-linearity correction

• Autorzy: Suchanek P. , Slepicka D. , Haasz V.
• Języki publikacji: EN

Abstrakty

EN

The performance of current electronic devices is mostly limited by analog front-end and analog-to-digital converter's (ADC) actual parameters. One of the most important parameters is ADC nonlinearity. The correction of this imperfection can be accomplished in the output data but only if the nonlinearity is well characterized. Many approaches to ADC characterization have been proposed in scientific articles in the last several years. In this paper three different approximations of ADC low-frequency non-linearity (common polynomials, Chebyshev polynomials and Fourier series) were analyzed and the practical applicability, approximation accuracy and noise sensitivity were investigated. The first results of nonlinearity correction were presented, too.

Słowa kluczowe

EN

analog-to-digital converter; ADC nonlinearity; transfer function approximation; nonlinearity correction

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2008
• Tom: Vol. 15, nr 4
• Strony: 501--511
• Opis fizyczny: Bibliogr. 11 poz., rys., tab., wykr.

Twórcy

autor

Suchanek P.

autor

Slepicka D.

autor

Haasz V.

• Czech Technical University in Prague, Faculty of Electrical Engineering, Prague, Czech Republic,

Bibliografia

• 1. Michaeli L., Michalko P., Saliga J.: “Fast Testing of ADC Using Unified Error Model”. Proceedings of the 17th IMEKO world congress, pp. 534-537, Dubrovnik, Croatia, 2003.
• 2. Serra A. C., da Silva M. F., Ramos P., Martins R. C., Michaeli L., Saliga J.: “Combined Spectral and Histogram Analysis for Fast ADC Testing”. IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 4, August 2005.
• 3. Björsell N., Händel P.: “Achievable ADC Performance by Postcorrection Utilizing Dynamic Modeling of the Integral Nonlinearity”. EURASIP Journal on Advances in Signal Processing, vol. 2008, Article ID 497187, 10 pages, 2008. doi:10.1155/2008/497187.
• 4. Saada N. H., Guindi R. S., Salama A. E.: “A New Approach for Modeling the Nonlinearity of Analog to Digital Converters Based on Spectral Components”. Behavioral Modeling and Simulation Workshop, Proceedings of the 2006 IEEE International, September 2006, pp. 120-125. ISBN:0-7803-9742-8
• 5. IEEE 1241-2000 Standard for Analog to Digital Converters. The Institute of Electrical and Electronics Engineers, 2001.
• 6. Suchanek P., Haasz V.: “Approaches to the ADC transfer function modeling”. Proceedings of the 15th IMEKO TC4 Symposium, Iasi, Romania, September, 2007.
• 7. Suchanek P., Slepicka D., Haasz V.: “Models of the ADC transfer function-sensitivity to noise”. Proceedings of the I2MTC 2008 - IEEE International Instrumentation and Measurement Technology Conference, Victoria, Canada, May 2008, pp. 583-587.
• 8. Attivissimo F., Giaquinto N., Kale I.: “INL reconstruction of A/D converters via parametric spectral estimation”, Transactions on Instrumentation and Measurement, vol. 53, no. 4 , pp. 940-946, August 2004.
• 9. Janik J. M., Fresnaud V.: “A spectral approach to estimate the INL of A/D converter”. Computer Standards & Interfaces, vol. 29, issue 1, January 2007, pp. 31-37.
• 10. Kouřil F., Vrba K.: Non-linear and parametric circuits: principles, theory and applications, Ellis Horwood Limited, Chicheste.
• 11. Adamo F., Attivissimo F., Giaquinto N., Savino M.: “FFT test of A/D converter to determine the integral nonlinearity”, Transactions on Instrumentation and Measurement, vol. 51, no. 5, October 2002, pp. 1050-1054.