Introduction to the t and chi-square distribution for a more accurate evaluation of measure of the Word Error Rate in Analog-to-Digital Converters

• Autorzy: Catelani M. , Zanobini A. , Ciani L.
• Języki publikacji: EN

Abstrakty

EN

The word error rate (WER) in an Analog to Digital Converter (ADC) is the probability of receiving an erroneous code for an input, after correction is made for gain, offset, and nonlinearity errors, and a specified allowance is made for noise. Typical causes of word errors are metastability and timing jitter of comparators within the ADC [1]. New statistical techniques which can better integrate what is sustained in the IEEE standard and in [2] have been proposed. In particular, Student and chi-square distributions have been introduced for a more accurate measurement of the word error rate in the case of n successive observations.

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2008
• Tom: Vol. 15, nr 4
• Strony: 485--490
• Opis fizyczny: Bibliogr. 7 poz., wzory

Twórcy

autor

Catelani M.

autor

Zanobini A.

autor

Ciani L.

• University of Florence, Department of Electronics and Telecommunications, Italy,

Bibliografia

• 1. IEEE Std. 1241, IEEE Standard for terminology an test methods for analog-to-digital converters, 2000.
• 2. Chiorboli, G.; De Salvo, B.; Franco, G.; Morandi, C.,: “Some thoughts on the word error rate measurement of A/D converters”. Electronics, Circuits and Systems, 1998 IEEE International Conference on Volume 3, vol.3, 7-10 Sept. 1998, pp.453-456.
• 3. Box, G. E. P., Hunter, W. G., Hunter, J. S.: Statistics for experimenters. John Wiley ,New York, N.Y., 1978.
• 4. Papoulis, A.: Probability and Statistics. Englewood Cliffs. NJ: Prentice-Hall, 1990.
• 5. Guide to the Expression of Uncertainty in Measurement, first edition (1993), corrected and reprinted (1995), ISO International Organization for Standardization (Geneva, Switzerland).
• 6. Welch, B. L., (1936), J. R. Stat. Soc. Suppl. 3, 29-48; (1938) Biometrika 29, 350-362; (1947), ibid. 34, 28-35.
• 7. Satterthwaite, F. E. (1941), Psychometrika 6, 309-316; (1946) Biometrics Bull. 2(5), 110-114.