Formal definition and properties of FEB-based ENOB of intelligent cyclic ADC

• Autorzy: Platonov A. A. , Małkiewicz Ł. , Jędrzejewski K.
• Języki publikacji: EN

Abstrakty

EN

The paper presents a new approach to the measurement of effective resolution (effective number of bits - ENOB) of the cyclic A/D converters (CADCs). The core idea of the approach is a direct measurement of ENOB using, as a numerical measure, the number of true bits before the first erroneous bit (FEB) in the code of the sample. The position of FEB is determined by the first non-zero bit in the binary presentation of the conversion error. The FEB-based definition of ENOB is introduced and discussed. The results of simulation evaluations of FEB distributions in sequential cycles of conversion are presented and values of FEB-based ENOB are compared with the conventional ENOB evaluations. The influence of DNL and INL errors of internal A/D converter on directly and conventionally measured values of ENOB is analysed. The proposed method of ENOB measurement is less dependent on the class of the testing signal and can be used for more adequate assessment of actual ADC resolution.

Słowa kluczowe

EN

A/D resolution; ENOB; intelligent cyclic A/D converters

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2008
• Tom: Vol. 15, nr 3
• Strony: 267--280
• Opis fizyczny: Bibliogr. 13 poz., rys., wykr.

Twórcy

autor

Platonov A. A.

autor

Małkiewicz Ł.

autor

Jędrzejewski K.

• Warsaw University of Technology, Faculty of Electronics and Information Technology, Warsaw, Poland,

Bibliografia

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• 4. Platonov A. A., Małkiewicz Ł. M.: Analytical and empirical ENOB in evaluation and analysis of cyclic A/D converters performance. Proc. of 5th IEE International Conference on Advanced A/D and D/A Conversion Techniques and Their Applications (ADDA 2005), Limerick, Ireland, 2005, pp. 325-330.
• 5. Platonov A. A., Małkiewicz Ł. M.: “Direct and indirect methods of ENOB evaluation and analysis”. Proc. of 14th IMEKO International Symposium on New Technologies in Measurement and Instrumentation and 10th Workshop on ADC Modeling and Testing, Gdynia-Jurata, Poland, 2005, pp. 595-601.
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