Quality assessment of high voltage varistors by third harmonic index

• Autorzy: Hasse L. , Smulko J.
• Języki publikacji: EN

Abstrakty

EN

High voltage varistors that consist mainly of grained ZnO have to be tested before assembling into a surge arrester. The existing methods demand a usage of high voltages and intensive currents that is inconvenient, destructive and needs extensive power consumption. Additionally, these methods require metallization of the prepared varistor structures that increases costs. We propose another method of varistor quality assessments by a third harmonic index measurement at relatively low voltage range. In this experimental study it has been proved that the proposed procedure can be applied successfully for preliminary selection of the tested structures.

Słowa kluczowe

EN

varistor; nonlinearity; quality assessment

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2008
• Tom: Vol. 15, nr 1
• Strony: 23--31
• Opis fizyczny: Bibliogr. 8 poz., fot., rys., wykr.

Twórcy

autor

Hasse L.

autor

Smulko J.

• Gdańsk University of Technology, Faculty of Electronics, Telecommunication and Informatics, Department of Optoelectronics and Electronic Systems, Poland,

Bibliografia

• 1. Chrzan K. L.: Overvoltages limiter for high voltages, Wrocław, Dolnośląskie Wyd. Edukacyjne 2003. (in Polish)
• 2. Eda K.: “Destruction mechanism of ZnO varistors due to high currents”, J. Appl. Phys., vol. 56, no. 10, 1984, pp. 2948-2955.
• 3. Modline F. A., Boatner L. A., Bartkowiak M., Mahan G. D., Wang H., Dinwiddie R. B.: “Influence of ceramic microstructure on varistor electrical properties”, Ceramic Trans., The American Ceramic Soc., vol. 100, 1999, pp. 469-491.
• 4. Reliability testing of nominally linear components by measuring third harmonic distortion. CLT 10. Component linearity test equipment. Application note of Danbridge, 2002.
• 5. Fagerhold P. O., Ewell G. J.: “Third harmonic testing”, 15th European Passive Components Symposium CARTSEurope, 2001, pp. 221-231.
• 6. LabVIEW Code Interface Reference Manual. National Istruments Corp., Austin TX, USA, September 1994.
• 7. Kuehl R. W.: “Reliability of thin-film resistors: impact of third harmonic screenings”, Microelectronics Reliability, vol. 42, 2002, pp. 807-813.
• 8. Vandamme E. P., Vandamme L. K. J.: “Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality assessment of resistors”, Microelectronics Reliability, vol. 40, 2000, pp. 1847-1853.