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Influence of the structure of signal conditioning circuits on the uncertainty of impedance measurement with algorithmic methods

Autorzy
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The article presents an estimation of the impedance measurement uncertainty determined in the measurement circuit with a two-channel sampling transducer. Using the Monte Carlo method, the influence of dynamic error and quantization error on the probability distribution of the impedance components error has been analysed. Comparison of these errors propagation has been made for three structures of conditioning circuits of voltage and current signals on measured impedance. On the basis of the obtained probability distribution, the value of the expanded uncertainty of impedance components has been determined.
Rocznik
Strony
530--541
Opis fizyczny
Bibliogr. 14 poz., rys., tab., wykr.
Twórcy
autor
  • Kielce University of Technology, Faculty of Electrical, Automatic Control and Computer Engineering, etmja@tu.kielce.pl
Bibliografia
  • 1. Angrasani L., Ferrigno L.: Reducing the uncertainty in real-time impedance measurements, Measurement, 30, 2001, pp. 307-315.
  • 2. Augustyn J.: Algorithms of signals processing for immitance components measurement systems, Metrology and Measurement Systems, no. 4 , 1999, pp. 223-230. (in Polish)
  • 3. Augustyn J.: A comparative evaluation of some LMS-based algorithms for calculating of impedance components in the sampling sensor instrument, in: Proc. XVIIth IMEKO World Congress, Dubrovnik, Croatia, vol. TC4, 2003, pp.778-782.
  • 4. Augustyn J.: Algorithmic methods of impedance measurement, Pomiary Automatyka Kontrola, no. 4, 2006, pp. 14-16. (in Polish)
  • 5. Augustyn J.: Algorithmic methods of impedance measurement, Monografie, Studia, Rozprawy no. 53, Wyd. Politechniki Świętokrzyskiej, Kielce, 2006. (in Polish)
  • 6. Augustyn J.: Impedance measurement uncertainty added by algorithmic methods, Pomiary Automatyka Kontrola, no. 10, 2007, pp. 3-6. (in Polish)
  • 7. Ramos P. M., Fonseca da Silva M., Cruz Serra A.: Low frequency impedance measurement using sine-fitting, Measurement, no. 29, 2004, pp.89-96.
  • 8. Jakubiec J.: Metrological and signal description of properties of measurement data processing algorithms, Materiały Konferencji ”Podstawowe Problemy Metrologii”, Ustroń, 14-17 maj 2006, Prace Komisji Metrologii Oddziału PAN w Katowicach, Seria: Konferencje no. 11, pp. 29-36. (in Polish)
  • 9. Jakubiec J.: System oriented mathematical model of single measurement result, Metrology and Measurement Systems, no. 4, 2006, pp. 407-420.
  • 10. Topór-Kamiński T.: Experimental determination of own errors of the chosen DFT algorithm form, Materiały Konferencji ”Podstawowe Problemy Metrologii”, Ustroń, 14-17 maj 2006, Prace Komisji Metrologii Oddziału PAN w Katowicach, Seria: Konferencje no. 11, pp. 341-352. (in Polish)
  • 11. Cox M. G., Siebert B. R. L.: The use of a Monte Carlo method for evaluating uncertainty and expanded uncertainty, Metrologia, no. 43, 2006, pp. 178-188.
  • 12. Evaluation of measurement data - Supplement 1 to the “Guide to the expression of uncertainty in measurement” - Propagation of distributions using a Monte Carlo method, Joint Committee for Guides in Metrology, September 2006.
  • 13. Jakubiec J.: Application of reductive interval arithmetic to uncertainty evaluation of measurement data processing algorithms, Monografia no. 27, Wyd. Politechniki Śląskiej, Gliwice, 2002.
  • 14. Guide to the expression of uncertainty in measurement, International Organization for Standarization, Geneva, 1995.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BSW1-0040-0005
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