Probe capacitance-dependent systematic error in I-V measurements of nanowires: analysis and correction

• Autorzy: Wawrzyniak M.
• Języki publikacji: EN

Abstrakty

EN

We propose a method of eliminating the systematic error due to the capacitance of digital oscilloscope probes in the experimental setup used for tracing current-voltage (I-V) curves of nanowires with quantum point contact (QPC). Used in I-V measurements, a digital storage oscilloscope (DSO) allows a reduction of measurement time to microseconds. Such short measurement time, however, involves a sensible effect of transition states occurring in an experimental setup representing an RC circuit. We analyze the effect of probe capacitance on the signal reading and on the resulting I-V curves, and derive theoretical formulae for the probe capacitance-dependent systematic error on the basis of a model proposed for the discussed measurement method. The systematic error is evidenced by nonlinearity of the obtained current-voltage curve, its shift with respect to the origin of the coordinate system, and an extension of the measurement range. We propose a correction method based on the derived theoretical relations that allow to calculate the corrections to be applied. The presented results of I-V measurements of nanowires with QPC confirm the correctness of our model and the efiectiveness of the method proposed.

Słowa kluczowe

EN

nanotechnology; nanowires; quantum point contacts; conductance quantization; conductance measurements; current-voltage curves

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2007
• Tom: Vol. 14, nr 3
• Strony: 391--408
• Opis fizyczny: Bibliogr. 22 poz., rys., tab., wykr.

Twórcy

autor

Wawrzyniak M.

• Poznań University of Technology, Faculty of Electronics and Telecommunications, Poland,

Bibliografia

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