Automatic execution of inspection plans with the I++ DME interface for industrial coordinate measurements

• Autorzy: Topfer S. C. N. , Linss G. , Rosenberger M. , Nehse U. , Weissensee K.
• Języki publikacji: EN

Abstrakty

EN

Due to the fast advancement of manufacturing technologies for micro- and nanostructured components and the increasing need for sophisticated inspection methods the paper discusses the prerequisites for automatic execution of inspection plans [1]. Based on the latest state-of-the-art, the setup and operating principle of a closed quality loop for dimensional inspections is described. The ongoing development of manufacturing technologies and the increasing complexity of specimen to be inspected require more than one sensor to perform dimensional measurements efficiently. The I++ DME (Dimensional Measurement Equipment) interface standard enables the interoperability of different measurement software with different coordinate measuring machines (CMM). A novel concept to integrate multiple sensors at one CMM via I++ DME rather than via proprietary interfaces is presented. The outlined novel concept is based on an I++ DME node.

Słowa kluczowe

EN

inspection planning; micro-metrology; nanometrology; multisensor measurements; I++ DME node

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2007
• Tom: Vol. 14, nr 1
• Strony: 71--87
• Opis fizyczny: Bibliogr. 30 poz., fot., rys., tab.

Twórcy

autor

Topfer S. C. N.

autor

Linss G.

autor

Rosenberger M.

autor

Nehse U.

autor

Weissensee K.

• Technische Universität Ilmenau, Department of Quality Assurance, Germany,

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