ADC and DAC modelling and testing - state of the art

• Autorzy: Cruz Serra A. , Daponte P. , Michaeli L.

Warianty tytułu

PL

Modelowanie i testowanie przetworników analogowo-cyfrowych i cyfrowo-analogowych - przegląd aktualnego stanu

• Języki publikacji: EN

Abstrakty

EN

The analog to digital front ends of measuring instruments affect crucially the interpretation of the signals acquired from the real world into the digital domain and their back presentation. The signal processing in the digital domain due to its stability meets usually the requirements on the uncertainty of the measuring instruments easily. ADCs and DACs influence dominantly the accuracy of instruments and limit the signal dynamics and their applicability. An exact error description and standardized testing methods are required by the end user. Moreover, the simplification of the error description by dominant error parameters is a permanent task for the metrologist and producers. This paper is aimed at providing a metrological overview of ADC and DAC topics by referring to their: i) architectures, ii) modelling and testing, and iii) standardization.

PL

Praca stanowi przegląd aktualnego stanu problematyki modelowania i testowania przetworników analogowo-cyfrowych (A/C) i cyfrowo-analogowych (C/A). Przedstawiono w niej modele błędów różnych typów przetworników A/C oraz standardowe i nowe metody testowania przetworników A/C i C/A z uwzględnieniem testów statystycznych i dynamicznych.

Słowa kluczowe

EN

A/D and D/A data converters; modelling; testing methods

PL

przetworniki analogowo-cyfrowe; przetworniki cyfrowo-analogowe; modelowanie; metody testowania

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2005
• Tom: Vol. 12, nr 3
• Strony: 231--248
• Opis fizyczny: Bibliogr. 39 poz., rys., wykr.

Twórcy

autor

Cruz Serra A.

• Technical University of Lisbon, Department of Electrical Engineering and Computers, Portugal

autor

Daponte P.

• University of Sannio, Department of Engineering, 82100 Benevento, Italy

autor

Michaeli L.

• Technical University of Košice, Department of Electronics and Telecommunications, Slovakia

Bibliografia

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