CLSM and UV-VIS researches on polyoxadiazoles thin films

• Autorzy: Weszka J. , Szindler M. , Chwastek-Ogierman M. , Bruma M. , Jarka P.
• Języki publikacji: EN

Abstrakty

EN

Purpose: The purpose of this paper was to analyse the surface morphology and optical properties of polyoxadiazoles thin films. Design/methodology/approach: A few different conducting polymers were dissolved in N-methyl-2-pyrrolid(in)one. Then the solutions were deposited on a glass substrate by spin coating method with a different spin rate. Changes in surface topography and optical properties were observed. A confocal laser scanning microscope CLSM Zeiss LSM 5 Exciter has been used. Photos have been taken from area of 120 x 120 microns. Findings: The analysis of images and spectra has confirmed that the quality of thin films depends upon the used polymers. It was also observed that the parameters of the spin coating method have significant effect on the morphology and the optical properties. The spin rate has got a strong impact on them. Research limitations/implications: The morphology and optical properties of polyoxadiazoles thin films has been described. This paper include description how the spin rate influence on the polymer thin films. In order to use a polymer thin film in photovoltaics or optoelectronics it must have a high internal transmission density. Further research of polymer thin films are recommended. Practical implications: The spin coating method allows to deposit a uniform thin films. It is important to know how the spin rate influence on the thin films properties. It is also important to find a new use for this group of material engineering in photovoltaic or optoelectronics devices. Originality/value: The good properties of thin films make them suitable for various applications. The value of this paper is defining the optimal parameters of spin-coating technology for polyoxadiazoles thin films. The results allow the choosing optimal parameters of the deposition process. Spin coating is a very good method to obtain thin films which are obligated to have the same thickness over the whole surface.

Słowa kluczowe

EN

conducting polymer; CLSM microscopy; UV-VIS spectrometer; spin coating method

PL

polimer przewodzący; mikroskopia CLSM; spektrometria UV-VIS; metoda powlekania obrotowego

• Wydawca: International OCSCO World Press
• Czasopismo: Archives of Materials Science and Engineering
• Rocznik: 2012
• Tom: Vol. 55, nr 2
• Strony: 53--61
• Opis fizyczny: Bibliogr. 20 poz.

Twórcy

autor

Weszka J.

autor

Szindler M.

autor

Chwastek-Ogierman M.

autor

Bruma M.

autor

Jarka P.

• Division of Materials Processing Technology, Management, and Computer Techniques in Materials Science, Institute of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland,

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