Topological analysis and diagnosis of analog circuits

• Autorzy: Starzyk J.

Warianty tytułu

PL

Topologiczna analiza i diagnostyka układów analogowych

• Języki publikacji: EN

Abstrakty

EN

This work presents a comprehensive view of topological methods for analog electronic circuit analysis and diagnosis. It details a number of issues related to proper understanding and efficient use of topological methods, starting from graph representation of the network topology, topological formulas used in circuit analysis, hierarchical decomposition of topological representations, and related computational algorithms. It shows how to generate multiconnections and multitrees for various types of topological analyses of analog networks represented by their graphs. Other types of topological analyses are also discussed. These include high frequency interconnect and clock networks of modern integrated circuits, and large change sensitivity based diakoptics of large analog networks that use network topology to improve efficiency of sparse matrix analysis algorithms. Topological techniques in analog fault diagnosis are also discussed. Network decomposition is used to effectively locate faults within subnetworks of the tested network. Fault location under parameter tolerances and corresponding topological conditions are developed for nodal and multiport representations. Network topology is beneficial to a popular sensitivity based testing by simplifying the test matrix (Jacobian matrix of the network equations). Fault diagnosis based on verification of the test equations related to the network topology has been developed. This led to formulation of ambiguity groups in low testability circuits and an effective use of the network topology to test such circuits. Final sections of this work make an efficient use of the network topology and information theory to select an optimum set of test points needed in both fault dictionary and verification methods used in analog fault diagnosis. Topologiczna analiza i diagnostyka układów analogowych

PL

Praca przedstawia syntetyczny opis metod topologicznych stosowanych do analizy i diagnostyki elektronicznych układów analogowych. W sposób szczegółowy przedstawia zagadnienia związane z właściwym zrozumieniem i efektywnym wykorzystaniem metod topologicznych, poczynając od graficznej reprezentacji topologii układu, poprzez formuły topologiczne użyte do analizy układu i hierarchiczną dekompozycję reprezentacji topologicznych, do stowarzyszonych algorytmów obliczeniowych. Pokazuje jak generować wielo-połączenia i wielo-drzewa dla różnych typów analizy topologicznej układów analogowych reprezentowanych grafami. Dyskutowane są też inne rodzaje analizy topologicznej. Wchodzą w to takie metody jak analiza połączeń wysokiej częstotliwości i sieci zegara nowoczesnych układów scalonych, czy też diakoptyka dużych układów analogowych w oparciu o metodę wrażliwości wielkoprzyrostowej, w której topologia układu jest wykorzystana do zwiększenia wydajności algorytmów analizy macierzy rzadkich. Dyskutowane są też techniki topologiczne stosowane do diagnostyki układów analogowych. Dekompozycja układu użyta jest do efektywnej lokalizacji uszkodzeń wewnątrz podukładów układu testowanego. Lokalizacja uszkodzeń przy uwzględnieniu tolerancji parametrów, wraz z niezbędnymi warunkami topologicznymi, jest rozwinięta dla reprezentacji węzłowej i wielo-wrotnikowej. Topologia układu usprawnia, opartą na wrażliwościach, popularną metodę testowania poprzez uproszczenie macierzy testowej (macierz Jakobianu równań układu). Rozwinięta została diagnostyka uszkodzeń w oparciu o weryfikacje równań testowych odniesionych do topologii układu. Doprowadziło to do zdefiniowania grup wieloznacznych w układach o niskiej testowalności i efektywnego użycia topologii układu do testowania takich układów. Końcowe sekcje pracy w sposób efektywny wykorzystują topologie układu i teorię informacji do optymalnego wyboru punktów pomiarowych potrzebnych przy testowaniu układów analogowych metodami słownikowymi i weryfikacji.

Słowa kluczowe

EN

analog circuit; topological analysis; diagnosis of circuits; fault location; testing of circuits

PL

układ analogowy; analiza topologiczna; diagnostyka układów; lokalizacja uszkodzeń; testowanie układów

• Wydawca: Wydawnictwo Politechniki Śląskiej
• Czasopismo: Zeszyty Naukowe. Elektronika / Politechnika Śląska
• Rocznik: 2007
• Tom: z. 15
• Strony: 3--141
• Opis fizyczny: Bibliogr. 287 poz.

Twórcy

autor

Starzyk J.

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