Methodology of maintainability and reliability prediction of technical objects

• Autorzy: Kasprzyk Z.
• Języki publikacji: EN

Abstrakty

EN

In recent times, an avalanche increase in the importance of reliability in the engineering design can be seen. The main reason is a permanent competition on the market and a competition for the customer resulting in increasing continually the efficiency of technological processes. The need to achieve a high level of reliability and maintainability is particularly important, where a safe and rapid transportation of people and goods is of high importance. The above-presented state of affairs has inspired the author to present a paper on the methodology and tools to support the estimation of maintainability and reliability of technical objects, together with practical examples.

Słowa kluczowe

EN

maintainability technical objects; reliability technical objects

PL

konserwacja obiektów technicznych; niezawodność obiektów technicznych

• Wydawca: Polskie Stowarzyszenie Telematyki Transportu
• Czasopismo: Archives of Transport System Telematics
• Rocznik: 2010
• Tom: Vol. 3, iss. 2
• Strony: 18--23
• Opis fizyczny: Bibliogr. 17 poz.

Twórcy

autor

Kasprzyk Z.

• Faculty of Transport, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland,

Bibliografia

• [1] MIL-HDBK-217 – Reliability Prediction of electronic Equipment. Revision F. Department of Defense. 02 December 1991
• [2] MIL-HDBK-217F - Reliability Prediction of Electronic Equipment. USA Department of Defense. 6.3 TRANSISTORS, LOW FREQUENCY, BIPOLAR, 28.II.1995 r.: Base Failure Rate - λb
• [3] MIL-HDBK-217F - Reliability Prediction of Electronic Equipment. USA Department of Defense. 6.3 TRANSISTORS, LOW FREQUENCY, BIPOLAR, 28.II.1995 r.: Temperature Factor – πT
• [4] MIL-HDBK-217F - Reliability Prediction of Electronic Equipment. USA Department of Defense. 6.3 TRANSISTORS, LOW FREQUENCY, BIPOLAR, 28.II.1995 r.: Power Rating Factor – πR
• [5] MIL-HDBK-217F - Reliability Prediction of Electronic Equipment. USA Department of Defense. 6.3 TRANSISTORS, LOW FREQUENCY, BIPOLAR, 28.II.1995 r.: Application Factor – πA
• [6] MIL-HDBK-217F - Reliability Prediction of Electronic Equipment. USA Department of Defense. 6.3 TRANSISTORS, LOW FREQUENCY, BIPOLAR, 28.II.1995 r.: Voltage Stress Factor – πS
• [7] MIL-HDBK-338 – Electronic Reliability Design Handbook. Department of Defense. 12 October 1988.
• [8] MIL-HDBK-338 – Electronic Reliability Design Handbook. Revision B. Department of Defense. 01 October 1991.
• [9] MIL-HDBK-472 – Maintainability Prediction. Department of Defense. 12 May 1966.
• [10] MIL-STD-1629 – Procedures for Performing a Failure Mode Effects and Critical Analysis. US Department of Defense. 24 November 1980.
• [11] NSWC-98/LE1. Naval Surface Warfare Center Handbook of Reliability Prediction Procedures for Mechanical Equipment. 1998.
• [12] Kasprzyk Z., Zastosowanie Metody Analizy Narażeń Części Do Prognozowania Obiektów Technicznych Na Przykładzie Pętli Przejazdowej Stosowanej W Systemie Poboru Opłat, XXXXVIII Zimowa Szkoła Niezawodności, Szczyrk 2010.
• [13] Kasprzyk Z., Predicting Reliability Of Technical Elements Taking The Part In The Process Of The Toll Collect On The Highway, Transport Systems Telematics 9th International Conference, Katowice-Ustroń 2009.
• [14] Kasprzyk Z., The Method Of The Parts Stress Analysis Prediction Of Technical Objects In The Supervision System, VIth Technical Conference LOGITRANS 2009, Szczyrk 2009.
• [15] Kasprzyk Z., The Reliability Model Of The Telematic Highway System, International Conference Transport of the 21st C, Warsaw 2004.
• [16] CHYBOWSKI L., MATUSZAK Z., Selected Software Supporting The Availability, Reliability, Maintainability And Operational Safety Multipurpose Analysis Of Complex Technical Systems, Maritime University of Szczecin, The 3rd International Conference Systems Supporting Environmental Management.
• [17] Lambda Predict version 3: Training Guide. ReliaSoft Publishing 2009.