Tytuł artykułu
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Warianty tytułu
Konferencja
APTADM 2007, III International Conference on Advances in Processing Testing and Application of Dielectric Materials., September, 26-28, 2007 Wrocław, Poland
Języki publikacji
Abstrakty
Reliable and undisturbed operation of electric and electronic circuits is mainly achieved through the use of appropriate overload protection elements such as overvoltage surge arrestors. The stability of the metal oxide varistors which are used insures that the circuits are adequately protected. The point of adding the varistor material with aluminium is the extension of the I_V characteristic's nonlinearity in high-current region [1]. In this work, both the viability of aluminum doping for ZnO varistors, and the effect of this doping on the ageing processes in varistors were investigated. The current trend is towards the production of better and more robust surge arrestors which utilize mainly ZnO varistors, and it was this trend which motivated these studies. The fundamental technological impediments include the repeatability of manufactured varistors and their susceptibility to ageing factors, such as current shocks, elevated operation temperature and the extended effect of the operation potential. Improving the varistors' imperviousness to ageing continues to be an imperative but, as yet, unsolved problem.
Słowa kluczowe
Rocznik
Tom
Strony
131--136
Opis fizyczny
Bibliogr. 11 poz
Twórcy
autor
autor
autor
autor
- Institute of Electrical Engineering Fundamentals, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland
Bibliografia
- [1] Kosman M.S., Petcsold E.G., O wozmoznosti izgotowlenija simietriczeskich varisiorov iz okisi cinka c primiestju okosl bizmuta, Uczonyje zapiski LGPT im. A.I. Gercena, Vol. 207, 1961, pp. 191-96.
- [2] HARRIS Semiconductor Transient Voltage Suppression Products Data book, Harris Corporation 1993.
- [3] Matsuoka M., Nonohmic properties of zinc oxide ceramics, Jpn. J. Appl. Phys., Vol. 10, No. 6, 1971, pp. 736-46.
- [4] Eda K., Iga A., Matsuoka M.: Degradation mechanism in non-ohmic ZnO ceramics, J. Appl. Phys., Vol. 51, No. 5, 1980, pp. 2678-2684.
- [5] Jaworski M., Wróblewski Z., Analytical reliability models of oxide varistors ZnO, Przegląd Elektrotechniczny, Vol. 76, 2000, pp. 1-5.
- [6] Philipp H.R., Levinson L.M., Degradation phenomena in zinc oxide varistors-a review. In: Advances in electronic ceramics, Vol. 7. Additives and interfaces in electronic ceramics. Ed.: Yan M.F., Hener A.H., Columbus, Ohio: Am. Ceram. Soc, 1984, pp. 1-21.
- [7] Hozer L., Semiconductor Ceramics: Grain Boundary Effects, Ellis Horwood Ltd., 1994.
- [8] Gubański A., Macalik B., Equipment for TSD Measurements in Solids, Bull, of Acad. Sc., Vol. 35, 1987, pp. 537-541.
- [9] Emtage P.R., The physics of zinc oxide varistors, J. Appl. Phys., Vol. 48, No. 10, 1977, pp. 4372-84.
- [10] Garlick G.F.J., Gibson A.F., The Electron Trap Mechanism of Luminescence in Sulphide and Silicate Phosphors, Proc. Phys. Soc, Vol. 60, 1948, pp. 574- 590.
- [11] Bucci C, Fieshi R., Guidi G., Ionic Thermo-currents in Dielectrics, Phys. Rev., Vol. 148, No. 2, 1966, pp. 816-23.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW9-0004-0057