Specular and diffuse X-ray reflectivity study of surfactant mediated Co/Cu multilayers

• Autorzy: Marszałek M. , Kąc M. , Krupiński M. , Polit A. , Zabila Y.
• Języki publikacji: EN

Abstrakty

EN

The application of X-ray techniques for studies of the interface structure of Co/Cu multilayers has been presented with a pre-deposited ultrathin film of Bi and Pb. The [Co(1 nm)/Cu(2 nm)] multilayers were thermally evaporated at very low deposition rates with a small amount of Bi and Pb surfactant (about 0.2 ML) introduced at each Cu layer. The structure of Co/Cu multilayers with added surfactant has been studied using low-angle specular and nonspecular X-ray reflectivity. In all studied specimens, the off-specular reflectivity replicates some of the features of specular reflectivity. The presence in diffuse spectra of a Bragg peak due to coherent scattering, as well as visible finite thickness clearly indicates a high degree of conformality and interface roughness replication in the surfactant mediated Co/Cu multilayers. X-ray reflectivity as well as X-ray diffuse scattering measurements showed a distinct variation in the structure of the multilayers with introduction of surfactant which leads to well-ordered periodic structures with small roughness.

Słowa kluczowe

EN

surfactant; surface segregation; Co/Cu multilayers; Auger electron spectroscopy; X-ray reflection; bismuth; lead

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2008
• Tom: Vol. 26, No. 3
• Strony: 735--741
• Opis fizyczny: Bibliogr. 15 poz.

Twórcy

autor

Marszałek M.

autor

Kąc M.

autor

Krupiński M.

autor

Polit A.

autor

Zabila Y.

• The H. Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, ul. Radzikowskiego 152, 31-342 Cracow,

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