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Structural, optical, electrical and magnetic properties of sol-gel derived Zn1-x-yCoxAlyO films

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Języki publikacji
EN
Abstrakty
EN
A detailed study has been presented of optical, electrical, structural and magnetic properties of Zn1.xCoxO (0 < x ≤ 0.25) films co-doped with 1 at. % of Al. The polycrystalline films have been synthesized on Corning glass 7059 substrates by the sol-gel technique using spin coating. Highly preferential c-axis oriented films have been obtained at the annealing temperature of 600 ° C. The lattice constant d of c-axis wurtzite Zn1.x.yCoxAlyO obeys Vegard�fs law for (0 < x ≤ 0.25). The inclusion of Al in ZnO is highly beneficial for the magnetism in ZnO because it enhances the free electron density. Optical spectra measurements reveal that band gap energy exhibits a blue shift upon increasing Co concentration. A positive magnetoresistance for Co doped ZnO and negative magnetoresistance for ZnO without cobalt at 77 K has been observed. The ferromagnetic behaviour has been confirmed by measurements using superconducting quantum interference device. The coercive field and the remanence increase with increase in Co content.
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659--673
Opis fizyczny
Bibliogr. 26 poz.
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Bibliografia
  • [1] WOLF S.A., AWSCHALOM D.D., BUHRMAN R.A., DAUGHTON J.M., VON MOLNAR S., ROUKES M.L., CHTCHELKANOVA A.Y., TREGER D.M., Science, 294 (2001), 1488.
  • [2] PRINZ G.A., Science, 282 (1998), 1660.
  • [3] PEARTON S.J., ABERNATHY C.R., OVERBERG M.E., THALER G.T., NORTON D.P., THEODOROPOULOU N., HEBARD A.F., PARK Y.D., REN F., KIM J., BOATNER L.A., J. Appl. Phys., 93 (2003), 8979.
  • [4] PRELLIER W., FOUCHET A., MERCEY B., J. Phys. Condes.Matter, 15 (2003), R1583.
  • [5] Spin Electronics, M. Ziese, M.J. Thornton (Eds.), Springer, Berlin, 2001.
  • [6] BUHRMAN R., WTEC Spin Electronics Workshop, Washington, DC, 2 Nov. 2001 (Viewgraphs from the presentation are available at http://www.wtec.org/spin/views/buhrman/index.htm).
  • [7] OHNO H., Science, 281 (1998), 951.
  • [8] NAJMUL A.M., SUGAHARA S., TANAKA M., Phys. Rev., B67 (2003), 241308.
  • [9] YANG S.G., PAKHOMOV A.B.,.HUNG S.T, WONG C.Y., IEEE Trans. Magn., 37 (2002), 2877.
  • [10] SATO K., KATYAMA-YOSHIDA H., Jpn. J. Appl. Phys., 40 (2001), L334.
  • [11] DIETL T., OHNO H., MATSUKURA F, CUBERT J, FERRAND D., Science, 287 (2000), 1019.
  • [12] XU X.H., BLYTHE H.J., ZIESE M., BEHAN A.J., NEAL J.R., MOKHTARI A., IBRAHIM R.M., FOX A.M., GEHRING G. A., New J. Phys., 8 (2006), 135.
  • [13] UEDA K., TABATA H., KAWAI T., Appl. Phys. Lett., 79 (2001), 988.
  • [14] HYEON-JUN LEE, SE-YOUNG JEONG, CHAE RYONG CHO, CHUL HONG PARK, Appl. Phys. Lett., 81 (2002), 4020.
  • [15] CHO W.K., CHOO Y.M, KIM H., KIM D., IHM Y., Appl. Phys. Lett., 80 (2002), 3358.
  • [16] RAMACHANDRAN S., TIWARI A., NARAYAN J., Appl. Phys. Lett., 84 (2004), 5255.
  • [17] KIM J.H., KIM H., KIM D., IHM Y. E. AND CHO W.K., J. Appl. Phys., 92 (2002), 6066.
  • [18] PARK J.H., KIM M.G., JANG H.M., RYU S., KIM Y.M., Appl. Phys. Lett., 84 (2004), 1338.
  • [19] BELGHAZI Y., SCHMERBER G., COLIS S., REHSPRINGER J.L., DINIA A., BERRADA A., Appl. Phys. Lett., 89 (2006), 122504.
  • [20] CULLITY B.D., Elements of X-Ray Diffraction, Addison-Wesley, Reading, MA, 1978.
  • [21] FUKUMURA T., JIN Z., OHTOMO A., KOINUMA H., KAWASAKI M., Appl. Phys. Lett., 75 (1999), 3366.
  • [22] OHTOMO A., KAWASAKI M., KOIDA T., MARUBUCHI K., SEGAWO Y., Appl. Phys. Lett., 72 (1998), 2466.
  • [23] SAGAR P., KUMAR M., MEHRA R.M., Mater. Sci.-Poland, 23 (2005), 685.
  • [24] SAWICKI M., DIETL T., KOSSUT J., IGALSON J., WOJTOWICZ T., PLESIEWICZ W., Phys. Rev. Lett., 56 (1986), 508.
  • [25] PIKUS F.G., PIKUS G.E., Solid State Commun., 100 (1996), 95.
  • [26] TOYOZAWA Y., J. Phys. Soc. Japan, 17 (1962), 986.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW8-0006-0037
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