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Thermally conductive adhesives are among major concerns of contemporary microelectronics. The main goal of ongoing research is to improve the thermal conductivity of these composites by using a proper filler material and the best shape and size of filler particles. In this work, it has been proven by numerical simulation that the polymer matrix may also play a crucial role, as the contact area between filler particles depends on the stresses that occur due to the shrinkage of the resin during curing. It has been observed that the resins relax with time. The time until the fully relaxed state is reached strongly depends on the temperature at which the system operates. In the considered case, the contact pressure is fully relaxed when it decreases from the initial value of 0.73 GPa to 0.03 GPa. When the temperature is 70°C, the contact pressure becomes fully relaxed after 10 seconds, but when it is lower than 40°C, the relaxation is completed after about 109 seconds (more than 30 years!). After the relaxation of contact pressure the thermal conductivity drops by approximately 50% of the initial thermal conductivity of the non-relaxed structure.
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Tom
Strony
45--55
Opis fizyczny
Bibliogr. 10 poz.
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autor
autor
autor
- Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, tomasz.falat@pwr.wroc.pl
Bibliografia
- [1] FAŁAT T., FELBA J., WYMYSŁOWSKI A., Proc. of 28th International Conference of IMAPS Poland Chapter, Wrocław, 2004, p. 219.
- [2] XU Y., CHUNG D.D.L., MROZ C., Composites A: Appl. Sci. Manufacturing, 32 (2001), 1749.
- [3] BOLGER J.C., Prediction and measurement of thermal conductivity of diamond filled adhesives, IEEE Publ. No 0569-5503/92/000-0219, 1992.
- [4] UKITA Y., TATEYAMA K., SEGAWA M., TOJO Y., GOTOH H., OOSAKO K., Proc. of IMAPS2004, Long Beach, USA, 2004, WA71.
- [5] LI H., JACOB K.I., WONG C.P., IEEE Trans. Adv. Packaging, 26 (2003), 25.
- [6] JANSEN K.M.B., WANG L., YANG D.G., VAN ’T HOF C., ERNST L.J., BRESSERS H.J.L., ZHANG G.Q., Proc. of IEEE 2004 Electronic Components and Technology Conference, Las Vegas, Nevada, 2004, p. 890.
- [7] JANSEN K.M.B., WANG L., VAN ‘T HOF C., ERNST L.J., BRESSERS H.J.L., ZHANG G.Q., Proc. 5th Int. Conf. on Thermal and Mechanical Simulation and Experiments in Micro-electronics and Micro-Systems EuroSimE, Brussels, 2004, p. 581.
- [8] MILOSHEVA B.V., JANSEN K.M.B., JANSSEN J.H.J., BRESSERS H.J.L., ERNST L.J., 6th. Int. Conf. on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, EuroSimE, Berlin, 2005, p. 462.
- [9] FAŁAT T., WYMYSŁOWSKI K., KOLBE J., Proc. of 5th International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics Polytronic2005, Wrocław, Poland, 2005, p. 180.
- [10] MEUWISSEN M.H.H., DE BOER H.A., STEIJVERS H.L.A.H., SCHREURS P.J.G., GEERS M.G.D., Microelectronics Reliability, 44 (2004), 1985.
Typ dokumentu
Bibliografia
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bwmeta1.element.baztech-article-BPW8-0003-0006