Research into the relationship between the surface topography, texture and mechanical properties of PVD-Cu/Ni multilayers

• Autorzy: Kucharska B. , Kulej E. , Pyka G. , Kanak J. , Stobiecki T.
• Języki publikacji: EN

Abstrakty

EN

The paper presents the results of structural examinations and mechanical tests of Cu/Ni multilayers fabricated by the magnetron sputtering method. The investigated multilayers were differentiated by Ni sublayer thickness (1, 3 and 6 nm), while the retaining Cu sublayer thickness was unchanged (2 nm). Measurements demonstrated that the multilayers were strongly textured in the direction of their growth [111], with the thinnest multilayer (Cu/Ni = 2/1) showing a stronger texture. Stronger texturing was associated with greater surface roughness. Multilayers with the largest thickness had higher hardness and Young's modulus. The properties of Cu/Ni multilayers depended both on the thickness of their sublayers, as well as on their total thickness.

Słowa kluczowe

EN

Cu/Ni multilayers; thermal stability; X-ray diffraction; texture; atomic force microscopy (AFM)

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2013
• Tom: Vol. 31, No. 1
• Strony: 101--107
• Opis fizyczny: Bibliogr. 13 poz., rys., tab., wykr.

Twórcy

autor

Kucharska B.

autor

Kulej E.

autor

Pyka G.

autor

Kanak J.

autor

Stobiecki T.

• Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200 Czestochowa

Bibliografia

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