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One of the methods of achieving high packaging density of passive elements on the PCB is using the capacitors embedded in multilayer PCB. Test structures consisting of embedded capacitors were fabricated using the FaradFlexŽ capacitive internal layers. Impedance spectroscopy and equivalent circuit modelling was used to determine their electrical properties such as the capacitance, parasitic resistance and inductance. The use of several stages of accelerated ageing allowed us to test the durability of the structures. The results showed good quality stability of the embedded elements. The spatial distribution of the capacitance of the test structures on the surface of the PCB form was tested. The influence of the process parameters during lamination on the values of embedded capacitors was revealed.
Słowa kluczowe
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Czasopismo
Rocznik
Tom
Strony
335--341
Opis fizyczny
Bibliogr. 11 poz., rys.
Twórcy
autor
autor
autor
autor
- Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology,ul. Janiszewskiego 11/17, 50-372 Wrocław, Poland
Bibliografia
- [1] DZIEDZIC A., KŁOSSOWICZ A., WINIARSKI P.,NITSCH K., PIASECKI T., KOZIOŁ G., STEPLEWSKI W., Przeglad Elektrotechniczny, in press.
- [2] STEPLEWSKI W., BORECKI J., KOZIOŁ G., ARAZNA A., DZIEDZIC A., MARKOWSKI P., Elektronika, 52 (2011) 119.
- [3] ULRICH R.K., SCHAPER L.W. (editors), Integrated Passive Component Technology, Wiley Interscience – IEEE Press, 2003.
- [4] MACDONALD J.R., Impedance Spectroscopy: Emphasizing Solid Materials and Systems, John Wiley, 1987.
- [5] BORSUKOV E., MACDONALD J.R., Impedance spectroscopy. Theory, Experiment and Applications, John Wiley, 2005.
- [6] Technical datasheet: FARADFLEX® BC8TM, BC12TM,Ultra Thin Advanced Electronic Materials.
- [7] Technical datasheet: FARADFLEX® BC8M, BC12M,BC16M and BC24M Ultra Thin Advanced Electronic Materials.
- [8] PIASECKI T., WRONSKI ´ M., DUDEK M., NITSCH K., Elektronika, 3 (2011) 74.
- [9] MULDER W.H., SLUYTERS J.H., PAJKOSSY T.,NYIKOS L., J. Electroanalytical Chemistry and Interfacial Electrochemistry, 285 (1990) 103.
- [10] JORCIN J-B., ORAZEM M.E., PEBERE N., TRIBOLLET B., Electrochimica Acta, 51 (2006) 1473.
- [11] TADASZAK K., NITSCH K., PIASECKI T., POSADOWSKI W., Microelectronics Reliability, 51 (2011) 1225.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0025-0018