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Influence of dielectric coverage on photovoltaic conversion of silicon solar cells obtained by epitaxial lateral overgrowth

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This work presents an analysis of the influence of SiO2 dielectric coverage of a Si substrate on the solar-cell efficiency of Si thin layers obtained by epitaxial lateral overgrowth (ELO). The layers were obtained by liquid phase epitaxy (LPE). All experiments were carried out under the following conditions: initial temperature of growth: 1193 K; temperature difference ^T = 60 K; ambient gas: Ar; metallic solvent: Sn+Al; cooling rates: 0.5 K/min and 1 K/min. To compare the influence of the interior reflectivity of photons, we used two types of dielectric masks in a shape of a grid etched in SiO2 along the <110> and <112> directions on a p+ boron-doped (111) silicon substrate, where silicon dioxide covered 70 % and 80 % of the silicon surface, respectively. The results obtained in this work depict the correlation between the interior efficiency and percentage of SiO2 coverage of the substrate of the ELO solar cells.
Wydawca
Rocznik
Strony
274--277
Opis fizyczny
Bibliogr. 7 poz.
Twórcy
autor
autor
  • Institute of Environmental Protection Engineering, Lublin University of Technology, Nadbystrzycka 38, 20-618 Lublin, Poland
Bibliografia
  • [1] JOZWIK I., KRAIEM J., OLCHOWIK J.M., FAVE A.,SZYMCZUK D., ZDYB A., Molecular Physics Reports 39(2004) 80.
  • [2] KASAP S., CAPPER P., Springer Handbook of Electronic and Photonic Materials; chap. 14, Springer 2006.
  • [3] OLCHOWIK J.M., GULKOWSKI S., CIESLAK K.,ZABIELSKI K., JOZWIK I., RUDAWSKA A., Journal ofNon-Crystalline Solids 354 (2008) 4423.
  • [4] CAMPBELL P.R., PhD thesis, University of New SouthWales, June, 1989.
  • [5] NISHINAGA T., Journal of Crystal Growth 237-239(2002), 1410.
  • [6] LUQUE A., HEGEDUS S., Handbook of PhotovoltaicScience and Engineering; Wiley 2003.
  • [7] JOZWIK I., OLCHOWIK J.M., Journal of Crystal Growth294 (2006), 367.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0023-0044
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