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Abstrakty
The improved approach for analysis of the thin film optical spectra exhibiting the interference fringes is presented. It is shown that, based on the positions of adjacent extrema, the interference order numbers can be easily identified allowing for determination of a model-free normal dispersion of the refraction coefficient provided the film thickness is known from an independent measurement. The usefulness of the presented method is illustrated by the analysis of the reflection spectra obtained for thin films of 3, 4, 9, 10-perylene tetracarboxylic dianhydride (PTCDA) with various thicknesses determined with the atomic force microscopy (AFM).
Czasopismo
Rocznik
Tom
Strony
181--192
Opis fizyczny
Bibliogr. 29 poz.
Twórcy
autor
autor
autor
- Institute of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
Bibliografia
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- [9] MARQUEZ E., RAMIREZ-MALO J.B., VILLARES P., JIMENEZ-GARAY R., SWANEPOEL R., Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra, Thin Solid Films 254(1–2), 1995, pp. 83–91.
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- [11] GONZALEZ-LEAL J.M., PRIETO-ALCON R., STRUCHLIK M., VLCEK M., ELLIOTT S.R., MARQUEZ E., Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating, Optical Materials 27(2), 2004, pp. 147–154.
- [12] PRADEEP J.A., AGARWAL P., Determination of thickness, refractive index, and spectral scattering of an inhomogeneous thin film with rough interfaces, Journal of Applied Physics 108(4), 2010, article 043515.
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- [14] SANTIC B., SCHOLZ F., On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films, Measurement Science and Technology 19(10), 2008, article 105303.
- [15] MARTINEZ-ANTON J.C., Determination of optical parameters in general film–substrate systems: A reformulation based on the concepts of envelope extremes and local magnitudes, Applied Optics 39(25), 2008, pp. 4557–4568.
- [16] LARENA A., MILLAN F., PEREZ G., PINTO G., Effect of surface roughness on the optical properties of multilayer polymer films, Applied Surface Science 187(3–4), 2002, pp. 339–346.
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- [18] MARQUEZ E., GONZALEZ-LEAL J.M., JIMENEZ-GARAY R., VLCEK M., Thermally- and photo-induced changes in the structure and optical properties of amorphous As40S30Se30 films, Thin Solid Films 396(1–2), 2001, pp. 184–191.
- [19] DOMARADZKI J., KACZMAREK D., PROCIOW E.L, WOJCIESZAK D., SIERADZKA K., MAZUR M., LAPINSKI M., Study of structural and optical properties of TiO2:Tb thin films prepared by high energy reactive magnetron sputtering method, Optica Applicata 39(4), 2009, pp. 815–823.
- [20] DJURISIC A.B., FRITZ T., LEO K., Modeling the optical constants of organic thin films: application to 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA), Optics Communications 183(1–4), 2000, pp. 123–132.
- [21] GORDAN O.D., HERMANN S., FRIEDRICH M., ZAHN D.R.T., Optical properties of 3,4,9,10-perylenetetracarboxylic dianhydride/copper phthalocyanine superlattices, Journal of Applied Physics 97(6), 2005, article 063518.
- [22] GORDAN O.D., SAKURAI T., FRIEDRICH M., AKIMOTO K., ZAHN D.RT., Ellipsometric study of an organic template effect: H2Pc/PTCDA, Organic Electronics 7(6), 2006, pp. 521–527.
- [23] ALONSO M.I., GARRIGA M., KARL N., OSSO J.O., SCHREIBER F., Anisotropic optical properties of single crystalline PTCDA studied by spectroscopic ellipsometry, Organic Electronics 3(1), 2002, pp. 23–31.
- [24] MARQUEZ E., GONZALEZ-LEAL J.M., BERNAL-OLIVA A.M., PRIETO-ALCON R., NAVARRO-DELGADO J.C., VLCEK M., Calculation and analysis of the complex refractive index of uniform films of the As–S–Se glassy alloy deposited by thermal evaporation, Surface and Coatings Technology 122(1), 1999, pp. 60–66.
- [25] SOLOMON I., Band-structure determination by subgap spectroscopy in thin films of semiconductors, Philosophical Magazine Part B 76(3), 1997, pp. 273–280. 192 J. CISOWSKI et al.
- [26] DJURISIC A.B., KWONG C.Y., GUO W.L., LIU Z.T., KWOK H.S., CHAN W.K., Spectroscopic ellipsometry of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA), Applied Physics A 77(5), 2003, pp. 649–653.
- [27] CHEYSSAC P., KLOTZ M., SONDERGARD E., STERLIGOV V.A., Scattering properties of ordered mesoporous silica films, Optics Communications 252(4–6), 2005, pp. 344–354.
- [28] HERZINGER C.M., JOHS B., MCGAHAN W.A., WOOLLAM J.A., PAULSON W., Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, Journal of Applied Physics 83(6), 1998, pp. 3323–3336.
- [29] SHALAAN E., SCHMITT H., Structural and optical properties of sputtered gadolinium nitride films, Optics Communications 260(2), 2006, pp. 588–594.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0019-0097