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Direct determination of the refraction index normal dispersion for thin films of 3, 4, 9, 10-perylene tetracarboxylic dianhydride (PTCDA)

Wybrane pełne teksty z tego czasopisma
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The improved approach for analysis of the thin film optical spectra exhibiting the interference fringes is presented. It is shown that, based on the positions of adjacent extrema, the interference order numbers can be easily identified allowing for determination of a model-free normal dispersion of the refraction coefficient provided the film thickness is known from an independent measurement. The usefulness of the presented method is illustrated by the analysis of the reflection spectra obtained for thin films of 3, 4, 9, 10-perylene tetracarboxylic dianhydride (PTCDA) with various thicknesses determined with the atomic force microscopy (AFM).
Czasopismo
Rocznik
Strony
181--192
Opis fizyczny
Bibliogr. 29 poz.
Twórcy
autor
autor
autor
  • Institute of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
Bibliografia
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  • [20] DJURISIC A.B., FRITZ T., LEO K., Modeling the optical constants of organic thin films: application to 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA), Optics Communications 183(1–4), 2000, pp. 123–132.
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0019-0097
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