Multispectral polarized BRDF: design of a highly resolved reflectometer and development of a data inversion method

• Autorzy: Riviere N. , Ceolato R. , Hespel L.
• Języki publikacji: EN

Abstrakty

EN

Multispectral and polarized light reflectance measurements are very useful to characterize materials such as paint coatings. This article presents an overview of an automated high-angular resolved, in-plane multispectral polarized reflectometer and its calibration process. A comprehensive study based on multispectral BRDF and DOLP measurements is conducted on different colour and glossy aspects of paint coatings. An original inverse method from in-plane measurements is used to model the out-of-plane BRDF and to investigate the role of the surface and subsurface scattering phenomena in its components.

Słowa kluczowe

EN

bidirectional reflectance distribution function (BRDF); degree of linear polarization (DOLP); multispectral; polarization; light scattering; paint coatings; inverse method; optimization

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2012
• Tom: Vol. 42, nr 1
• Strony: 7--22
• Opis fizyczny: bibliogr. 20 poz.,

Twórcy

autor

Riviere N.

autor

Ceolato R.

autor

Hespel L.

• Onera - The French Aerospace Lab, F-31055, Toulouse, France

Bibliografia

• [1] MYOUNG KOOK SEO, KANG YEON KIM, DUCK BONG KIM, KWAN H. LEE, Efficient representation of bidirectional reflectance distribution functions for metallic paints considering manufacturing parameters, Optical Engineering 50(1), 2011, article 013603.
• [2] VOSS K.J., CHAPIN A., MONTI M., ZHANG H., Instrument to measure the bidirectional reflectance distribution function of surfaces, Applied Optics 39(33), 2000, pp. 6197–6206.
• [3] BRAKKE T.W., Goniometric measurements of light scattered in the principal plane from leaves, Proceedings of Geoscience and Remote Sensing Symposium, IGARSS, 1992.
• [4] JAFOLLA J.C., THOMAS D.J., HILGERS J.W., REYNOLDS W.R., BLASBAND C., Theory and measurement of bidirectional reflectance for signature analysis, Proceedings of SPIE 3699, 1999, p. 2.
• [5] LELOUP F.B., FORMENT S., DUTRE P., POINTER M.R., HANSELAER P., Design of an instrument for measuring the spectral bidirectional scatter distribution function, Applied Optics 47(29), 2008,pp. 5454–5467.
• [6] CHUNNILALL C.J., CLARKE F.J.J., SMART M.P., HANSSEN L.M., KAPLAN S.G., NIST–NPL comparison of mid-infrared regular transmittance and reflectance, Metrologia 40(1), 2003, pp. 55–59.
• [7] BETTY C.L., FUNG A.K., IRONS J., The measured polarized bidirectional reflectance distribution function of a Spectralon calibration target, Proceeding of Geoscience and Remote Sensing Symposium, Vol. 4, 1996, pp. 2183–2185.
• [8] ELLIS K.K., Polarimetric bidirectional reflectance distribution function of glossy coatings, Journal of the Optical Society of America A 13(8), 1996, pp. 1758–1762.
• [9] HANER D.A., MCGUCKIN B.T., BRUEGGE C.J., Polarization characteristics of Spectralon illuminated by coherent light, Applied Optics 38(30), 1999, pp. 6350–6356.
• [10] NICODEMUS F.E., Directional reflectance and emissivity of an opaque surface, Applied Optics 4(7),1965, pp. 767–773.
• [11] HANER D.A., MCGUCKIN B.T., MENZIES R.T., BRUEGGE C.J., DUVAL V., Directional-hemispherical reflectance for Spectralon by integration of its bidirectional reflectance, Applied Optics 37(18),1998, pp. 3996–3999.
• [12] BECKMANN P., Shadowing of random rough surfaces, IEEE Transactions on Antennas and Propagation 13(3), 1965, pp. 384–388.
• [13] XIAO D. HE, TORRANCE K.E., SILLION F.X., GREENBERG D.P., A comprehensive physical model for light reflection, ACM SIGGRAPH Computer Graphics 25(4), 1991, pp. 175–186.
• [14] TORRANCE K.E., SPARROW E.M., Theory for off-specular reflection from roughened surfaces, Journal of the Optical Society of America 57(9), 1967, pp. 1105–1112.
• [15] COOK R.L., TORRANCE K.E., A reflectance model for computer graphics, ACM Transactions on Graphics (TOG) 1(1), 1982, pp. 7–84.
• [16] LI H., TORRANCE K.E., A practical, comprehensive light reflection model, Program of Computer Graphics, Technical Report PCG-05-03, Cornell University, 2005.
• [17] PHONG B.T., Illumination for computer generated images, Communications of ACM 18(6), 1975,pp. 311–317.
• [18] NOCEDAL J., WRIGHT S.J., Numerical Optimization, 2nd Ed., Springer-Verlag, Berlin, New York,2006.
• [19] LI H., TORRANCE K.E., Validation of the Gonioreflectometer, Program of Computer Graphics,Technical Report PCG-03-02, Cornell University, 2003.
• [20] SEARS F.W., Optics, Addison-Wesley Press, 1949.