Impact of dielectric deterioration on the conducted EMI emissions in the DC-DC boost converter

• Autorzy: Musznicki P. , Schanen J. L. , Granjon P. , Juszcz J.

Warianty tytułu

PL

Wpływ starzenia się dielektryków na poziom zaburzeń generowanych w impulsowym układzie podwyższającym napięcie

• Języki publikacji: EN

Abstrakty

EN

The magnitude of emitted noise generated by DC-DC converters depends of their electrical behavior and parameters. Some of these can change during the converter life time, especially due to some deterioration process. In this paper the impact of the dielectric materials aging is presented using both circuit simulation and a digital signal processing method based on Wiener filtering. The change of the total EMI spectrum as a function of the dielectric property has been investigated. Application can be either aging diagnostig, or a forecast of the EMI spectrum evolution with the time.

PL

W artykule przedstawiono wpływ starzenia kondensatorów elektrolitycznych na poziom zaburzeń elektromagnetycznych generowanych przez układ podwyższający napięcie w oparciu o metody symulacyjne oraz cyfrowe przetwarzanie sygnału (filtracje Wienera). Wyniki przedstawiono w formie widm zaburzeń generowanych przez układ oraz transmitancji pomiędzy źródłem zaburzeń a zaburzeniami

Słowa kluczowe

EN

EMC; aging process; computer simulation; Wiener filtering

PL

kompatybilność elektromagnetyczna; starzenie; symulacje komputerowe; filtracje Wienera

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2011
• Tom: R. 87, nr 2
• Strony: 179--183
• Opis fizyczny: bibliogr. 19 poz., rys. 10,

Twórcy

autor

Musznicki P.

autor

Schanen J. L.

autor

Granjon P.

autor

Juszcz J.

• Politechnika Gdańska,

Bibliografia

• [1] A. Lahyani, P. Venet, G. Grellet, and P. J. Viverge. Failure prediction of electrolytic capacitors during operation of a switchmode power supply. IEEE Transactions on Power Electronics, 13(6):1199--1207, 1998.
• [2] T.J. Kim, J.-W. Baek, J.-H. Jeon, G.-H. Rim, and C.-U. Kim. A diagnosis method of DC/DC converter aging based on the variation of parasitic. In Proc. 30th Annual Conference of IEEE Industrial Electronics Society IECON 2004, volume 3, pages 3037--3041 Vol. 3, 2004
• [3] T. Yorozuya, N. Takasu, K. Suganuma, K. Takahashi, K. Kamba, and T. Ichiwara. Study on diagnostic method of deterioration for power capacitors. In Proc. 3rd International Conference on Properties and Applications of Dielectric Materials, pages 745--748 vol.2, 1991.
• [4] P. Musznicki, J.L. Schanen, B. Allard, and P. J. Chrzan. Accurate modeling of layout parasitic to forecast EMI emitted from a DC-DC converter. In Proc. IEEE 35th Annual Power Electronics Specialists Conf. PESC 04, vol. 1, 278--283 2004.
• [5] P. Musznicki, J.L. Schanen, P. Granjon, and P. J. Chrzan. The Wiener filter applied to EMI decomposition. IEEE Transactions on Power Electronics, 23(6):3088--3093, 2008.
• [6] J.-S. Lai, H. Xudong, E. Pepa, C. Shaotang, and T. Nehl. Inverter EMI modeling and simulation methodologies. IEEE Transactions on Industrial Electronics, 53(3):736--744, 2006.
• [7] L. Yang, B. Lu, W. Dong, Z. Lu, M. Xu, F. Lee, and W. Odendaal. Modeling and characterization of a 1 kw ccm pfc converter for conducted EMI prediction. In Proc. Nineteenth Annual IEEE Applied Power Electronics Conference and Exposition APEC '04, volume 2, pages 763--769, 2004.
• [8] P. Musznicki. Conducted EMI identification in Power Electronic converters. VDM Verlag, 2009.
• [9] M. Sayani. DC-DC converter using all surface-mount components and insulated-metal substrate. In Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Ann., 639--646, 1992.
• [10] M. Gitau. Modeling conducted EMI noise generation and propagation in boost converters. In Industrial Electronics, 2000. ISIE 2000. Proceedings of the 2000 IEEE International Symposium on, volume 2, pages 353--358, 2000
• [11] B. Allard, H. Garrab, W. Mi, K. Ammous, and H. Morel. Switching parameter maps-a new approach to the validity domain of power device models. In Proc. IEEE 34th Annual Power Electronics Specialist Conference PESC '03, volume 3, pages 1220--1225, 15--19 June 2003.
• [12] E. Bogatin. A closed form analytical model for the electrical properties of microstrip interconnects. Components, Hybrids, and Manufacturing Technology, IEEE Transactions on, 13(2):258--266, 1990.
• [13] A. E. Ruehli. Inductance calculations in a complex integrated circuit environment. IBM Journal of Research and Development, 16(5):470--481, Sept. 1972.
• [14] C. Martin, J.L. Schanen, and R. Pasterczyk. Power integration: electrical analysis of new emerging package. 10th European Conference on Power Electronics and Applications EPE'03, June 2002.
• [15] K. Kurokawa. Power waves and the scattering matrix. IEEE Transactions on Microwave Theory and Techniques, 13(2):194--202, Mar 1965.
• [16] D. G. Manolakis, V. K. Ingle, and S. M. Kogan. Statistical and adaptive signal processing: spectral estimation, signal modeling, adaptive filtering, and array processing. Artech House, Inc, 2005.
• [17] S.-V. Vaseghi. Advance digital signal processing and noise reduction. John Wiley and Sons Ltd, 2000.
• [18] K. Harada, A. Katsuki, and M. Fujiwara. Use of esr for deterioration diagnosis of electrolytic capacitor. IEEE Transactions on Power Electronics, 8(4):355--361, 1993.
• [19] M. C. Lanca, C. J. Dias, D. K. Das Gupta, and J. Marat-Mendes. Comparative study of dielectric relaxation spectra of electrically and thermally aged low density polyethylene. In Proc. Annual Report Electrical Insulation and Dielectric Phenomena Conference on, pages 161--164, 2003.