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The role of antireflective coatings in silicon solar cells - the influence on their electrical parameters

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Języki publikacji
EN
Abstrakty
EN
In this work, the authors compared the properties of multicrystalline silicon solar cells which depended on the kind of following antireflective layers: a-Si:C:H, a-Si:N:H and TiOx. Current-voltage characteristics for multicrystalline silicon solar cells were measured by the use of a computer controlled global spectrum sun simulator under an AM 1.5. The measurements of I-V characteristics allow the determination of basic electrical parameters and efficiency using the double exponential relationship from a two-diode solar cells model. Two key parameters: refractive index and thickness of the film affect the final features of the antireflective coating. Optimisation of these parameters and afterwards the experimental verification lead to the minimalisation of the reflection coefficient that decides about the quality of the antireflective layer. A high quality reflective layer can improve the efficiency of the solar cell even by 30%.
Czasopismo
Rocznik
Strony
487--492
Opis fizyczny
Bibliogr. 15 poz.
Twórcy
autor
autor
autor
autor
  • AGH - University of Science and Technology, Department of Electronics, al. Mickiewicza 30, 30-059 Kraków, Poland
Bibliografia
  • [1] VAN OVERSTRAETEN R.J., MERTENS R.P., Heavy doping effects in silicon, Solid-State Electronics 30(11), 1987, pp. 1077–1087.
  • [2] FRISSON L., CHEEK G., MERTENS R.P., VAN OVERSTRAETEN R.J., Proceedings of 5th European Photovoltaics, Adam Hilger, Bristol, 1986.
  • [3] GREEN M.A., Solar Cells. Operating Principles, Technology and System Applications, The University of New South Wales, Kensington, 1986.
  • [4] LIPINSKI M., ZIEBA P., JONAS S., KLUSKA S., SOKOŁOWSKI M., CZTERNASTEK H., Optimisation of SiNx :H layer for multicrystalline silicon solar cells, Opto-Electronics Review 12(1), 2004, pp. 41–44.
  • [5] SWATOWSKA B., CZTERNASTEK H., LIPINSKI M., STAPINSKI T., ZAKRZEWSKA K., Antireflective coatings of a-Si:C:H on silicon, Proceedings of XXVIII International Conference of IMAPS Poland Chapter, Wroclaw, September 26–29, 2004, pp. 385–388.
  • [6] CHAKRAVARTY B.C., VINOD P.N., SINGH S.N., CHAKRABORTY B.R., Design and simulation of antireflection coating for application to silicon solar cells, Solar Energy Materials and Solar Cells 73(1), 2002, pp. 59–66.
  • [7] STAPINSKI T., SWATOWSKA B., a-Si:C:H and a-Si:N:H thin films obtained by PECVD for applications in silicon solar cells, Journal of Electronic Materials 37(6), 2008, pp. 905–911.
  • [8] PANEK P., LIPINSKI M., BELTOWSKA-LEHMAN E., DRABCZYK K., CIACH R., Industrial technology of multicrystalline silicon solar cells, Opto-Electronics Review 11(4), 2003, pp. 269–275.
  • [9] GRANEK F., ZDANOWICZ T., Advanced system for calibration and characterization of solar cells, Opto-Electronics Review 12(1), 2004, pp. 57–67.
  • [10] SWANEPOEL R., Determination of the thickness and optical constants of amorphous silicon, Journal of Physics E: Scientific Instruments 16(12), 1983, pp. 1214–1222.
  • [11] TAUC J., Amorphous and Liquid Semiconductors, Plenum Press, New York, 1974.
  • [12] FOWLES G.R., Indroduction to Modern Optics, Rinehart and Winston, New York, 1968.
  • [13] SWATOWSKA B., STAPINSKI T., Amorphous hydrogenated silicon-nitride films for applications in solar cells, Vacuum 82(10), 2008, pp. 942–946.
  • [14] RICHARDS B.S., COTTER J.E., HONSBERG C.B., WENHAM S.R., Novel uses of TiO2 in crystalline silicon solar cells, Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE, September 15–22, 2000, pp. 375–378.
  • [15] APPELBAUM J., CHAIT A., THOMPSON D., Parameter estimation and screening of solar cells, Progress in Photovoltaics: Research and Applications 1(2), 1993, pp. 93–106.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0017-0027
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