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Structural and optical properties of vanadium oxides prepared by microwave-assisted reactive magnetron sputtering

Wybrane pełne teksty z tego czasopisma
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Języki publikacji
EN
Abstrakty
EN
In this work, structural and optical properties of vanadium oxides have been presented. Thin films were manufactured by microwave-assisted magnetron sputtering process. Particles were sputtered from a vanadium target in Ar/O2 atmosphere. Oxygen partial pressure was changing from 3×10-4 to 7×10-4 Torr. After the deposition, the thin films were additionally annealed at 400 °C in ambient air in order to oxidize the films. Structural investigation was performed with the aid of X-ray diffraction measurements and Raman spectroscopy. The results obtained from both methods have revealed that as-deposited films were amorphous, while annealed films had V2O5 crystal form. Optical properties were determined by transmission measurements in the spectral range from 250 to 2500 nm. As-deposited films had low transmission (below 10%), but oxidization by additional annealing of the structure resulted in the increase of the transmission level up to about 20 and 43% at 650 nm wavelength for samples prepared under 3×10-4 and 7×10-4 Torr oxygen partial pressure, respectively. The analysis of the structure and optical properties of the thin films has revealed the influence of deposition parameters on the properties of vanadium oxides.
Czasopismo
Rocznik
Strony
463--469
Opis fizyczny
Bibliogr. 17 poz.
Twórcy
autor
autor
autor
autor
  • Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland
Bibliografia
  • [1] WU Q.-H., THISSEN A., JAEGERMANN W., LIU M., Photoelectron spectroscopy study of oxygen vacancy on vanadium oxides surface, Applied Surface Science 236(1–4), 2004, pp. 473–478.
  • [2] WANG X.J., LI H.D., FEI Y.J., WANG X., XIONG Y.Y., NIE Y.X., FENG K.A., XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering, Applied Surface Science 177(1–2), 2001, pp. 8–14.
  • [3] LEE S.-H., CHEONG H.M., LIU P., TRACY C.E., Improving the durability of amorphous vanadium oxide thin-film electrode in a liquid electrolyte, Electrochemical and Solid-State Letters 6(6), 2003, pp. A102–A105.
  • [4] FANG G.J., LIU Z.L., WANG Y., LIU Y.H., YAO K.L., Synthesis and structural, electrochromic characterization of pulsed laser deposited vanadium oxide thin films, Journal of Vacuum Science and Technology A 19(3), 2001, pp. 887–892.
  • [5] EL MANDOUH Z.S., SELIM M.S., Physical properties of vanadium pentoxide sol gel films, Thin Solid Films 371(1–2), 2000, pp. 259–263.
  • [6] RAMANA C.V., HUSSAIN O.M., SRINIVASULU NAIDU B., REDDY P.J., Spectroscopic characterization of electron-beam evaporated V2O5 thin films, Thin Solid Films 305(1–2), 1997, pp. 219–226.
  • [7] MENG L.-J., PLACIDO F., Annealing effect on ITO thin films prepared by microwave-enhanced dc reactive magnetron sputtering for telecommunication applications, Surface and Coatings Technology 166(1), 2003, pp. 44–50.
  • [8] MENG L.-J., CROSSAN E., VORONOV A., PLACIDO F., Indium–tin-oxide thin film prepared by microwave-enhanced d.c. reactive magnetron sputtering for telecommunication wavelengths, Thin Solid Films 422(), 2002, pp. 80–86.
  • [9] RAMANA C.V., HUSSAIN O.M., PINTO R., JULIEN C.M., Microstructural features of pulsed-laser deposited V2O5 thin films, Applied Surface Science 207(1–4), 2003, pp. 135–138.
  • [10] JULIEN C., NAZRI G.A., BERGSTROM O., Raman scattering studies of microcrystalline V6O13, Physica Status Solidi (B) 201(1), 1997, pp. 319–326.
  • [11] LEE S.H., CHEONG H.M., SEONG M.J., LIU P., TRACY C.E., MASCARENHAS A., PITTS J.R., DEB S.K., Raman spectroscopic studies of amorphous vanadium oxide thin films, Solid State Ionics 165(1–4), 2003, pp. 111–116.
  • [12] CLARK R.J.H., The Chemistry of Titanium and Vanadium, Elsevier, New York, 1968.
  • [13] MANNING T.D., PARKIN I.P., Vanadium(IV) oxide thin films on glass and silicon from the atmospheric pressure chemical vapour deposition reaction of VOCl3 and water, Polyhedron 23(18), 2004, pp. 3087–3095.
  • [14] KRISHNAKUMAR S., MENON C.S., Optical and electrical properties of vanadium pentoxide thin films, Physica Status Solidi (A) 153(2), 1996, pp. 439–444.
  • [15] KHAN G.A, HOGARTH C.A., Optical absorption spectra of evaporated V2O5 and co-evaporated V2O5 /B2O3 thin films, Journal of Materials Science 26(2), 1991, pp. 412–416.
  • [16] ALY S.A., MAHMOUD S.A., EL-SAYED N.Z., KAID M.A., Study on some optical properties of thermally evaporated V2O5 films, Vacuum 55(2), 1999, pp. 159–163.
  • [17] MENG L.-J., SILVA R. A., CUI H.-N., TEIXEIRA V., DOS SANTOS M.P., XU Z., Optical and structural properties of vanadium pentoxide films prepared by d.c. reactive magnetron sputtering, Thin Solid Films 515(1), 2006, pp. 195–200.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0017-0024
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