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Tytuł artykułu

Vacuum in microsystems - generation and measurement

Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This paper reviews the current state of art of vacuum encapsulation of microsystems. Different types of bonding techniques and "integrated sealing process" are described. It is concluded that the step forward in vacuum sealing of MEMS structures should be elaboration of MEMS-type micropump, which would be integrated with microsystem structure. A novel concept of a miniature orbitron pump is presented. It is also reported how vacuum inside the micropump can be measured. It is proposed that for measurement of a low vacuum level, a membrane sensor can be used, and for a high or ultra-high vacuum level - an ionization sensor. Both sensors should be integrated with a micropump structure. The results of membrane sensor study are presented.
Słowa kluczowe
Czasopismo
Rocznik
Strony
389--394
Opis fizyczny
Bibliogr. 15 poz.
Twórcy
autor
autor
  • Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Bibliografia
  • [1] TAI-RAN HSU, MEMS Packaging, INSPEC, London, UK, 2004.
  • [2] YUFENG JIN, ZHENFENG WANG, LEI ZHAO, PECK CHENG LIM, JUN WEI, CHEE KHUEN WONG, Zr/V/Fe thick film for vacuum packaging of MEMS, Journal of Micromechanics and Microengineering 14(5), 2004, pp. 687–692.
  • [3] NAJAFI K., Micropackaging technologies for integrated microsystems: Application to MEMS and MOEMS, Proceedings of SPIE 4979, 2003, pp. 1–19.
  • [4] TANG W.C., TU-CUONG H. NGUYEN, JUDY M.W., HOWE R.T., Electrostatic-comb drive of lateral polysilicon resonators, Sensors and Actuators A 21(1–3), 1990, pp. 328–331.
  • [5] TSUCHIYA T., KAGEYAMA Y., FUNABASHI H., SAKATA J., Polysilicon vibrating gyroscope vacuum--encapsulated in an on-chip micro chamber, Sensors and Actuators A 90(1–2), 2001, pp. 49–55.
  • [6] BARTEK M., FOERSTER J.A., WOLFFENBUTTEL R.F., Vacuum sealing of microcavities using metal evaporation, Sensors and Actuators A 61(1–3), 1997, pp. 364–368.
  • [7] DZIUBAN J.A., Bonding in Microsystem Technology, Springer, London, 2006.
  • [8] CHAVAN A.V., WISE K.D., Batch-processed vacuum-sealed capacitive pressure sensors, Journal of Microelectromechanical Systems 10(4), 2001, pp. 580–588.
  • [9] SPARKS D., MASSOUD-ANSARI S., NADER NAJAFI N., Reliable vacuum packaging using nanogetters and glass frit bonding, Proceedings of SPIE 5343, 2004, pp. 70–78.
  • [10] VABOND: Long-Term Stability of Vacuum-Encapsulated MEMS Devices Using Eutectic Wafer Bonding, Project Funded under 5th FWP.
  • [11] CHIAO M., LIN L., Device-level hermetic packaging of microresonators by RTP aluminum-to-nitride bonding, Journal of Microelectromechanical Systems 15(3), 2006, pp. 515–522.
  • [12] KOOPS H.W., A miniaturized Orbitron pump for MEMS applications, Technical Digest of the 18th IVNC 2005, July 10–14, 2005, pp. 364–365.
  • [13] GRZEBYK T., GÓRECKA-DRZAZGA A., Planarne polowe źródło elektronów, Elektronika 6, 2010, pp. 108–110 (in Polish).
  • [14] WILFERD ST., EDELMANN CHR., Miniaturized vacuum gauges, Journal of Vacuum Science and Technology A 22(2), 2004, pp. 309–320.
  • [15] BOSSEBOEUF A., GRANDCHAMP J.P., BRELUZEAU C., LANI S., PALOMO J., BOUVILLE D., Vacuum measurement in wafer level encapsulations by interference microscopy, Microsystem Technologies 12(10–11), 2005, pp. 1063–1069.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0017-0014
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