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The principle of multilayer plane-parallel structure antireflection

Wybrane pełne teksty z tego czasopisma
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Języki publikacji
EN
Abstrakty
EN
The principle of two- and three-layer transparent system antireflection is based on the method of Fabry–Perot multiple-beam interference spectrum envelopes and it is shown that the presence of half-wave and quarter-wave layer thicknesses or their combination is sufficient but not necessary for its achievement. The necessary condition is the condition of overlapping of interference layer envelopes, therefore the antireflection effect can be observed at arbitrary ratios of optical layer thicknesses, angles of incidence and optical refraction index of media when the condition is satisfied for the minimum of interference contour in the required spectral region.
Czasopismo
Rocznik
Strony
759--765
Opis fizyczny
Bibliogr. 20 poz.
Twórcy
autor
  • Lviv Polytechnic National University, S. Bandera 12 St., 79646, Lviv, Ukraine
Bibliografia
  • [1] TAYLOR H., The Adjustment and Testing of Telescope Objectives, T. Cooke and Sons, York, England,1896.
  • [2] TIMOPHEEVA N.F., Journal of Experimental and Theoretical Physics (JETP) 6, 1936, p. 71.
  • [3] STRONG J., On a method of decreasing the reflection from nonmetallic substances, Journal of the Optical Society of America 26(1), 1936, pp. 73–74.
  • [4] GREBENSCHIKOV I.V., VLASOV A.G., NEPORENT B.S., SUYKOVSKAYA N.V., Anti-Reflective Coating,Moscov, 1946, p. 212.
  • [5] SCHUSTER K., Anwendung der Vierpoltheorie auf die Probleme der optischen Reflexionsminderung,Reflexionsverstärkung und der Interferenzfilter, Annalen der Physik 439(4), 1949, pp. 352–356.
  • [6] LISITSA M.P., Reflection and transmission system of thin and thick dielectric layers, JTF 24, 1954,pp. 1837–1850.
  • [7] CATALAN L.A., Some compouted optical properties of antireflection coatings, Journal of the Optical Society of America 52(4), 1962, pp. 437–439.
  • [8] MOYS B.A., The theory of double-layer antireflection coatings, Thin Solid Films 21(1), 1974,pp. 145–157.
  • [9] MOUCHART J., BEGEL J., CHALOT S., Stabilisation spectrale des dépôts optiques en couches minces,Journal of Modern Optics 34(10), 1987, pp. 1297–1325.
  • [10] HEAVEHS O.S., Optical Properties of Thin Solid Films, Butterworths Scientific Publications, London,1955.
  • [11] DOBROWOLSKI J.A., Optical properties of films and coatings, [In] Handbook of Optics, [Ed.] M. Bass,2nd Ed., McGraw-Hill, 1995.
  • [12] MADSEN C.K., ZHAO J.H., Optical Filter Desing and Analysis: A signal Proceesing Approach,Wiely-Interscience, New York, Chichester, Brisbane, Toronto, Singapure, 1999.
  • [13] MACLEOD H.A., Thin-Film Optical Filters, 3rd Ed., Institute of Physics Publishing Bristol and Philadelphia, 2003, Chapter 3, p. 515.
  • [14] KOSOBUTSKYY P.S., KUSHNIR O.P., Envelopes of optical interference spectra for duplex and triplex layered structures, Ukrainian Journal of Physics and Optics 9(2), 2008, pp. 73–81.
  • [15] SIZOV F.F., KLYUI N.I., LUK’YANOV A.N., SAVKINA R.K., SMIRNOV A.B., EVMENOVA A.Z.,Antireflection properties of diamond-like carbon films on Cd1 –xZnxTe (x ~ 0.04) single crystals,Technical Physics Letters 34(5), 2008, pp. 377–380.
  • [16] FENG ZHANG, HUILI ZHU, WEIFENG YANG, ZHENGYUN WU, HONGJI QI, HONGBO HE, ZHENGXIU FAN,JIANDA SHAO, Al2O3/SiO2 films prepared by electron-beam evaporation as UV antireflection coatings on 4H-SiC, Applied Surface Science 254(10), 2008, pp. 3045–3048.
  • [17] SHUI-YANG LIEN, DONG-SING WUU, WEN-CHANG YEH, JUN-CHIN LIU, Tri-layer antireflection coatings (SiO2/SiO2–TiO2/TiO2) for silicon solar cells using a sol–gel technique, Solar Energy Materials and Solar Cells 90(16), 2006, pp. 2710–2719.
  • [18] FRÄNZ I., LANGHEINRICH W., The investigation of double layers in semiconductor technology,Solid-State Electronics 13(6), 1970, pp. 807–814.
  • [19] WALTER T., WELFORD M., Useful Optics, The University of Chicago Press, Chigaco, London, 1991.
  • [20] SURESH KUMAR DHUNGEL, JINSU YOO, KYUNGHAE KIM, SUNGWOOK JUNG, SOMNATH GHOSH, JUNSIN YI,Double-layer antireflection coating of MgF2/SiNx for crystalline silicon solar cells, Journal of the Korean Physical Society 49(3), 2006, pp. 885–889.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0014-0024
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