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The effects of HCl-based chemical and Ar+ sputter etching treatment on (100) GaAs surface properties with the aim to develop the procedure of surface preparation before metal deposition have been investigated. Variable angle spectroscopic ellipsometry, X-ray photoelectron spectroscopy, atomic force microscopy and photoluminescence have been used to study the surface characterization. We show that combining chemical etching in 5% HCl with Ar+ sputter etching gives the best results for surface cleaning prior to metal deposition. The application of this two-step treatment allows to obtain Ni/AuGe/Ni/Au ohmic contact with rc = 2×10–6 .omega.cm2 with excellent adhesion and long-term thermal stability.
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Tom
Strony
787--797
Opis fizyczny
bibliogr. 13 poz.,
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autor
autor
autor
autor
autor
autor
autor
autor
autor
- Institute of Electron Technology, al. Lotników 32/46, 02-668 Warsaw, Poland
Bibliografia
- [1] SIRTORI C., PAGE H., BECKER C., ORTIZ V., GaAs-AlGaAs quantum cascade lasers: physics, technology, and prospects, IEEE Journal of Quantum Electronics 38(6), 2002, pp. 547–558.
- [2] KOSIEL K., BUGAJSKI M., SZERLING A., KUBACKA-TRACZYK J., KARBOWNIK P., PRUSZYŃSKA--KARBOWNIK E., MUSZALSKI J., ŁASZCZ A., ROMANOWSKI P., WASIAK M., NAKWASKI W., MAKAROWA I., PERLIN P., 77 K operation of AlGaAs/GaAs quantum cascade laser at 9 μ m, Photonics Letters of Poland 1(1), 2009, pp.16–18.
- [3] KOSIEL K., KUBACKA-TRACZYK J., KARBOWNIK P., SZERLING A., MUSZALSKI J., BUGAJSKI M., ROMANOWSKI P., GACA J., WÓJCIK M., Molecular-beam epitaxy growth and characterization of mid-infrared quantum cascade laser structures, Microelectronics Journal 40(3), 2009, pp. 565–569.
- [4] PAPIS-POLAKOWSKA E., Surface treatment of GaSb and related materials for the processing of mid-infrared semiconductor devices, Electron Technology: Internet Journal 37/38, 2005/2006, pp. 1–34.
- [5] ZHAO Q., DENG Z.W., KWOK R. W.M., LAU W.M., Damage of InP (100) induced by low energy Ar+and He+ bombardment, Journal of Vacuum Science and Technology A 18(5), 2000, pp. 2271–2276.
- [6] GOODMAN S.A., AURET F.D., DEENAPANARY P.N.K., MYBURG G., Electrical properties of Sc Schottky barrier diodes fabricated on argon-ion sputtered p-GaAs, Japanese Journal of Applied Physics, Part 2: Letters and Express Letters 37(1A/B), 1998, pp. L10–L12.
- [7] GHITA R.V., NEGRILA C., MANEA A.S., LOGOFATU C., CERNEA M., LAZARESCU M.F., X-ray photoelectron spectroscopy study on n-type GaAs, Journal of Optoelectronics and Advanced Materials 5(4), 2003, pp. 859–863.
- [8] WOLAN J.T., EPLING W.S., HOFLUND G.B., Characterization study of GaAs (001) surfaces using ion scattering spectroscopy and x-ray photoelectron spectroscopy, Journal of Applied Physics 81(9),1997, pp. 6160–6164.
- [9] J.A. Woollam Co. Inc. WVASE 32 program v. 3.441, tabulated at UNL (Lincoln University,Nebraska, USA).
- [10] MOULDR J.F., STICKLE W.F., SOBOL P.E., BOMBEN K.D., Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics, 1995.
- [11] REEVES E.H., Specific contact resistance using a circular transmission line model, Solid State Technology 23, 1980, pp. 487–490.
- [12] XING-FEI HE, Fractional dimensionality and fractional derivative spectra of interband optical transitions, Physical Review B 42(18), 1990, pp. 11751–11756.
- [13] YU ZHAOXIAN, MO DANG, Property of Van Hove critical points in fractional-dimensional space, Chinese Physics Letters 10(7), 1993, pp. 385–388.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0012-0099