The influence of the prefiring temperature on the structure and surface morphology of sol-gel derived ZnO film

• Autorzy: Hwang K. S. , Hwangbo S. , Kim J. T.
• Języki publikacji: EN

Abstrakty

EN

Show aC-axis oriented ZnO thin films were prepared on silica glass substrates by the sol-gel method using a zinc naphthenate precursor. As-deposited films were prefired at 250 °C for 60 min, at 350 °C for 30 min, and at 500 °C for 10 min, followed by final annealing at 600-900 °C in air. Crystal structure, surface morphology, surface roughness and transmittance at the visible range were analyzed by high resolution X-ray diffraction, field emission scanning electron microscopy, scanning probe microscopy, and ultraviolet spectrophotometry. (002)-oriented ZnO films were obtained by annealing at 600 °C, and at higher temperatures for the films prefired at 350 °C and 500 °C. All the films exhibited a high transmittance, above 80%, in the visible region, and showed a sharp fundamental absorption edge at 0.38-0.40 žm. The most highly c-axis oriented ZnO with a homogeneous surface was observed at a prefiring temperature of 350 °C.

Słowa kluczowe

EN

ZnO thin film; sol-gel method; zinc naphthenate

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2009
• Tom: Vol. 27, No. 1
• Strony: 159--170
• Opis fizyczny: Bibliogr. 17 poz.

Twórcy

autor

Hwang K. S.

autor

Hwangbo S.

autor

Kim J. T.

• Department of Applied Optics and Institute of Optoelectronic Technology, Nambu University,864-1 Wolgye-dong, Gwangsan-gu,Gwangju 506-824, Republic of Korea

Bibliografia

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