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Application of the phase imaging and force modulation SPM techniques for description of the dispersion of multiwalled carbon nanotubes (MWCNTs) in polyol (polyester diol- PED) matrix is presented. The MWCNTs-PED mixture is used to prepare polyurethane (PUR) nanocomposites. Dispersion of MWCNTs in PUR depends on the dispersion of carbon nanotubes in polyol. It is very important to evaluate the degree of homogeneity of the investigated materials. The phase imaging and force modulation microscopy connected with tapping mode allow collecting not only topography images but also images of mechanical properties of a material (hardness, adhesion, friction). By using these SPM modes, it is possible to distinguish structural elements of the mixture and hence to obtain direct information about the distribution of MWCNTs in PED matrix.
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Tom
Strony
245--253
Opis fizyczny
Bibliogr. 14 poz.
Twórcy
autor
autor
autor
autor
autor
autor
- Faculty of Materials Science and Engineering, Warsaw University of Technology, ul. Wołoska 141, 02-507 Warsaw, Poland
Bibliografia
- [1] GREENE M.E., KINSER C.R., KRAMER D.E., PINGREE L.S.C., HERSAM M.C., Microscopy Res. Techn., 64 (2004), 415.
- [2] CHEN X., DAVIES M.C., ROBERTS C.J., TENDLER S.J.B., WILLIAMS P.M., DAVIES J., DAWKES A.C., EDWARDS J.C., Ultramicroscopy 75 (1998), 171.
- [3] BAR G., THOMANN Y., BRANDSCH R., CANTOW H.J., WHANGBO M.H., Langmuir, 13 (1997), 3807.
- [4] BRANDSCH R., BAR G., WHANGBO M.H., Langmuir, 13 (1997), 6349.
- [5] NAGAO E., DVORAK J.A., Biophys. J., 76 (1999), 3289.
- [6] PANG G.K.H., BABA-KISHI K.Z., PATEL A., Ultramicroscopy, 81 (2000), 35.
- [7] GARCIA R., PEREZ R., Surf. Sci. Rep., 47 (2002), 197.
- [8] A Practical Guide to Scanning Probe Microscopy SPM, Veeco Instruments Inc., 2005, pp. 5, 6, 9, 12, 15, 26.
- [9] MAIVALD P., BUTT H.J., GOULD S.A.C., PRATER C.B., DRAKE B., GURLEY J.A., ELINGS V.B., HANSMA P.K., Nanotechn., 2 (1991),103.
- [10] RADMACHER M., TILMANN R .W., GAUB H.E., Biophys. J., 64 (1993), 735.
- [11] MultiMode™ SPM Instruction Manual Version 4.31ce, Digital Instruments Veeco Metrology Group, 1996–1999, pp. 11.25–11.28.
- [12] RYSZKOWSKA J., JURCZYK–KOWALSKA M., SZYMBORSKI T., KURZYDŁOWSKI K.J., Physica E, 39 (2007), 124.
- [13] NanoScope Command Reference Manual Version 5.12 Revision B, Digital Instruments/Veeco Metrology Group, Inc, 2001, p. 15.42
- [14] MIRONOV V.L., Fundamentals of Scanning Probe Microscopy, Russian Academy of Sciences, Institute for Physics of Microstructures, 2004, pp. 31–35.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0007-0190