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Influence of Eu dopant on optical properties of TiO2 thin films fabricated by low pressure hot target reactive sputtering

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Języki publikacji
EN
Abstrakty
EN
This work presents the influence of europium dopant on optical properties of TiO2:Eu3+ thin films fabricated by low pressure hot target reactive sputtering. Thin films were deposited from metallic Ti-Eu mosaic target on different substrates (i.e., monocrystalline silicon and SiO2). Selected samples were additionally annealed for 4 hours in an air ambient at 200 °C after deposition. Thin films were examined by means of scanning electron microscopy with energy disperse spectrometer (SEM-EDS), X-ray diffraction (XRD), optical transmission method and photoluminescence (PL). From SEM-EDS measurements total Eu concentration in fabricated thin films was determined. XRD analysis revealed the existence of crystalline TiO2 in the form of anatase and rutile in examined samples with smaller and larger amount of Eu dopant, respectively. Optical transmission method showed that doping with selected amount of Eu results in different shift of the fundamental absorption edge for prepared thin films. PL studies showed a red luminescence of TiO2:Eu3+ thin films. The intensity of luminescence increased with the annealing temperature and decreased with larger amount of europium.
Czasopismo
Rocznik
Strony
117--122
Opis fizyczny
Bibliogr. 14
Twórcy
autor
autor
  • Wroclaw University of Technology, Wyb. Wyspianskiego 27, 50-370 Wroclaw, Poland
Bibliografia
  • [1] PALOMINO-MERINO R., CONDE-GALLARDO A., GARCÍA-ROCHA M., HERNÁNDEZ-CALDERON I., CASTANO V., RODRÍGUEZ R., Photoluminescence of TiO2:Eu3+ thin films obtained by sol–gel on Si and Corning glass substrates, Thin Solid Films 401(1–2), 2001, pp. 118–23.
  • [2] JIA CH., XIE E., PENG A., JIANG R., YE F., LIN H., XU T., Photoluminescence and energy transfer of terbium doped titania film, Thin Solid Films 496(2), 2006, pp. 555–9.
  • [3] ZHANG X.T., LIU Y.C., MA J.G., LU Y.M., SHEN D.Z., XU W., ZHONG G.Z., FAN X.W., Room-temperature blue luminescence from ZnO:Er thin films, Thin Solid Films 413(1–2), 2002, pp. 257–61.
  • [4] PODHORODECKI A., KUDRAWIEC R., MISIEWICZ J., GAPONENKO N.V., TSYRKUNOW D., 1.54 μm photoluminescence from Er-doped sol-gel derived In2O3 films embedded in porous anodic alumina, Optical Materials 28(6–7), 2006, pp. 685–7.
  • [5] KUDRAWIEC R., PODHORODECKI A., MIROWSKA N., MISIEWICZ J., MOLCHAN I.S., GAPONENKO N.V., LUTICH A.A., GAPONENKO S.V., Photoluminescence investigation of europium-doped alumina, titania and indium sol-gel-derived films in porous anodic alumina, Material Science and Engineering B 105(1–3), 2003, pp. 53–6.
  • [6] ZENG Q.G., DING Z.J., ZHANG Z.M., Synthesis, structure and optical properties of Eu3+/TiO2 nanocrystals at room temperature, Journal of Luminescence 118(2), 2006, pp. 301–7.
  • [7] DOMARADZKI J., BORKOWSKA A., KACZMAREK D., PROCIÓW E.L., Properties of transparent oxide thin films prepared by plasma deposition, Optica Applicata 35(3), 2005, pp. 425–30.
  • [8] PENG A., XIE E., JIA CH., JIANG R., LIN H., Photoluminescence properties of TiO2:Eu3+ thin films deposited on different substrates, Materials Letters 59(29–30), 2005, pp. 3866–9.
  • [9] DOMARADZKI J., KACZMAREK D., PROCIOW E.L., BORKOWSKA A., SCHMEISSER D., BEUCKERT G., Microstructure and optical properties of TiO2 thin films prepared by low pressure hot target reactive magnetron sputtering, Thin Solid Films 513(1–2), 2006, pp. 269–74.
  • [10] QI J., MATSUMOTO T., TANAKA M., MASUMOTO Y., Europium silicate thin films on Si substrates fabricated by a radio frequency sputtering method, Journal of Physics D: Applied Physics 33(16), 2000, pp. 2074–8.
  • [11] CHANG C., MAO D., Long lasting phosphorescence of Sr4Al14O25:Eu2+, Dy3+ thin films by magnetron sputtering, Thin Solid Films 460(1–2), 2004, pp. 48–52.
  • [12] Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM, Philadelphia, PA, 1967, Card 21–1272.
  • [13] Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM, Philadelphia, PA, 1967, Card 21–1276.
  • [14] DIEBOLD U., The surface science of titanium dioxide, Surface Science Reports 48(5–8), 2003, pp. 53–229.
  • [15] MANIFACIER J.C., GASIOT J., FILLARD J.P., A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film, Journal of Physics E: Scientific Instruments 9(11), 1976, pp. 1002–4.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0007-0113
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