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Warianty tytułu
Konferencja
Conference New Materials for Magnetoelectronics, Będlewo, 3-6 May 2006
Języki publikacji
Abstrakty
Evolution of the domain structure (DS) in ultrathin cobalt films, deposited on sapphire substrate with the following structure: X\Au\Co(dCo nm thick layer or wedge)\X (dX nm thick layer or wedge perpendicular to Co wedge axis)\Au (where X is V or Mo) with perpendicular magnetization was investigated as a function of thickness dX. The study was performed using an optical polarizing microscope with CCD camera. Images of DS were recorded during various stages of magnetization reversal. A special software based on LabViewŽ was employed for acquisition and processing of domain images. To analyze the observed domain structures, topology properties of magnetic images were determined. Preferential orientation of domain walls was found in ultrathin Co covered by Mo but not by V.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
403--410
Opis fizyczny
Bibliogr. 10 poz.
Twórcy
autor
autor
autor
autor
autor
autor
autor
autor
- Institute of Experimental Physics, University of Białystok, Lipowa 41, 15-424 Białystok, Poland
Bibliografia
- [1] HEINRICH B., BLAND J.A.C., Ultrathin Magnetic Structures, Springer, Berlin, 1994 and references therein.
- [2] KISIELEWSKI M., MAZIEWSKI A., TEKIELAK M., WAWRO A., BACZEWSKI L.T., Phys. Rev. Lett., 89 (2002), 87203 and references therein.
- [3] HOPSTER H., OEPEN H.P., Magnetic microscopy of nanostructures, NanoScience and Technology, Springer, Berlin, 2005.
- [4] KISIELEWSKI M., KURANT Z., TEKIELAK M., DOBROGOWSKI W., MAZIEWSKI A., WAWRO A., BACZEWSKI L.T., Phys. Status Sol. (a), 196 (2003), 129.
- [5] STEFANOWICZ W., TEKIELAK M., BUCHA W., MAZIEWSKI A., ZABLOTSKII V., BACZEWSKI L.T., WAWRO A., Mater. Sci.-Poland, 24 (2006), 783.
- [6] RITTER G.X., WILSON J.N., Handbook of Computer Vision Algorithms in Image Algebra, CRC Press, Boca Raton, Fl, USA, 1996.
- [7] PATURI P., HVOLBEK LARSEN B., JACOBSEN B.A., ANDERSEN N.H., Rev. Sci. Instr., 74 (2003), 2999.
- [8] FERRE J., GROLIER V., MEYER P., MAZIEWSKI A., STEFANOWICZ E., TARASENKO S.V., TARASENKO V.V., KISIELEWSKI M., RENARD D., Phys. Rev. B, 55 (1997), 15092.
- [9] SAHOO P.K., SOLTANI S., WONG A.K.C., CHEN Y.C. Comp. Vision Graph. Image Proc., 41 (1988), 233.
- [10] ZHANG T.Y., SUEN C.Y., Comm. ACM, 27 (1984), 236.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0007-0041