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Photoemission study of Eu 2+/3+ ions in ferromagnetic (Eu,Gd)Te semiconductor layers

Identyfikatory
Warianty tytułu
Konferencja
Conference New Materials for Magnetoelectronics, Będlewo, 3-6 May 2006
Języki publikacji
EN
Abstrakty
EN
(Eu,Gd)Te ferromagnetic semiconductor layers grown by molecular beam epitaxy technique on BaF2 (111) monocrystalline substrates were investigated by resonant photoemission spectroscopy using synchrotron radiation. In n-(Eu,Gd)Te layers, a ferromagnetic transition induced by electron concentration is observed. Magnetic as well as electrical properties of this material depend strongly on the charge state (2+ vs. 3+) of Eu and Gd ions known to be sensitive to crystal stoichiometry and formation of oxide complexes. The relative concentration of Eu2+ and Eu3+ ions was determined from the analysis of the resonant photoemission energy distribution curves (EDC), measured at photon energies close to 4d-4f resonance. After various in-situ annealing and Ar sputtering procedures, a clear improvement of crystal stoichiometry of (Eu,Gd)Te layers was observed as manifested by the increase of Eu2+ intensity in the spectra. Contribution of Eu 4f shell to the total density of states was also analyzed and found at the valence band edge for Eu2+ ions and about 6 eV lower for Eu3+ ions.
Wydawca
Rocznik
Strony
377--382
Opis fizyczny
Bibliogr. 7 poz.
Twórcy
autor
autor
autor
autor
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
Bibliografia
  • [1] HOLTZBERG F., MCGUIRE T.R., METHFESSEL S., J. Appl. Phys., 37 (1966), 976.
  • [2] WATCHER P., Handbook on the Physics and Chemistry of the Rare Earth, North Holland, Amsterdam, 1979.
  • [3] MAUGER A., GODART C., Phys. Rep., 141 (1986), 51.
  • [4] MOLNAR VON S., J. Supercond., 16 (2003), 1.
  • [5] DZIAWA P., TALIASHVILI B., DOMUCHOWSKI W., ŁUSAKOWSKA E., ARCISZEWSKA M., DEMCHENKO I., DOBROWOLSKI W., DYBKO K., FEDORYCH O.M., NADOLNY A.J., OSINNIY V., PETROUCHYK A., STORY T., Acta Phys. Pol. A, 106 (2004), 215.
  • [6] DZIAWA P., OSINNIY V., TALIASHVILI B., DOMUKHOVSKI V., ŁUSAKOWSKA E., DYBKO K., DOBROWOLSKI W., KOWALCZYK L., STORY T., GOIRAN M., Proc. 12th Int. Conf. on Narrow Gap Semiconductors, Toulouse 2005, IOP Conf. Ser., 187 (2006), 21.
  • [7] KOWALSKI B.J., GOŁACKI Z., GUZIEWICZ E., KOZANECKI A., ORŁOWSKI B.A., GHIJSEN J., JOHNSON R.L., J. Alloys Comp., 286 (1999), 121.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0007-0037
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