High frequency magneto-impedance effect in glass-coated amorphous Co83.2 B3.3 Si5.9 Mn7.6 microwires

• Autorzy: Lee H. , Kim Y. S. , Yu S. C.
• Języki publikacji: EN

Abstrakty

EN

The measurements of the giant magneto-impedance (GMI) were carried out in the amorphous Co83.2B3.3Si5.9Mn7.6 micro-wires at high frequency range from 100 MHz up to 1 GHz of an accurrent flowing along the wire and at varying axial dc-magnetic field in its range of š120 Oe. The wires, about 15žm in diameter, were fabricated by a glass-coated melt spinning technique. The shape of the impedance curves plotted vs. a dc-field is changing dramatically with the frequency. The phase angle was also strongly dependent on this field. The maximum value of GMI, around 250%, was reached at the frequency of about 500 MHz. The external dc-magnetic field changes the circumferential permeability as well as the penetration depth, both in turn change the impedance of the sample. The increments of GMI at high frequency can be understood in terms of the LC- resonance phenomena. The sudden change of the phase angle, as large as 180°, evidenced the occurrence of the resonance at a given intensity of the external dc-field.

Słowa kluczowe

EN

magnetoimpedance effect; microwires; magnetic sensors

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Materials Science
• Rocznik: 2003
• Tom: Vol. 21, No. 1
• Strony: 115--121
• Opis fizyczny: Bibliogr. 7 poz.

Twórcy

autor

Lee H.

• Department of Physics Education, Kongju National University, Kongju, Korea

autor

Kim Y. S.

• Departament of Physics Chungbuk National University, Chongju 361-763, Korea

autor

Yu S. C.

• Departament of Physics Chungbuk National University, Chongju 361-763, Korea

Bibliografia

• [1] Kim Y.K., Cho W.S., Kim T.K., Kim C.O., LeeHeebok, J. Appl. Phys., 83 (1998), 6575.
• [2] Panina L.V., Katoh H., Mohri K., KawashimaK., IEEE Trans. Magn., 29 (1993), 2524.
• [3] Panina L.V., Mohri K., BushidaK., Noda M., J. Appl. Phys., 76 (1994), 6198.
• [4] Ciureanu P., Britel M., Menard D., Yelon A., Akyel C., Rouabhi M., Cochrane R.W., Rudkowski P., Strom-Olsen J.O., J. Appl. Phys., 83 (1998), 6563.
• [5] Machado F.L.A., de Araujo A., Puca A., Rodrigues A.R., Rezende S.M., Phys. Stat. Solidi (a), 173 (1999), 135.
• [6] Atkinson D., Squire P.T., J. Appl. Phys., 83 (1998), 6569.
• [7] Vazquez M., J. Magn. Magn. Mater., 226-230 (2001), 693.