PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Tytuł artykułu

Development of highly transparent and conducting yttrium-doped ZnO films: the role of sol-gel stabilizers

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Yttrium-doped zinc oxide (YZO) thin films were deposited with the dip coating technique. The effect of different sol-gel stabilizers (lactic acid with hydrolysis, without hydrolysis, and diethanolamine (DEA)) on structural, electrical and optical properties of the produced films were investigated. The stability of solutions prepared with DEA was much higher than that of other stabilizers. Films deposited using this solution also exhibited good adherence to the substrate, preferential orientation, and the lowest full width at half maximum of (002) X-ray diffraction peak. Average transmittance in the visible region increased by 14.6% and resistivity decreased by two orders of magnitude as the stabilizer was changed from lactic acid to DEA. The lowest resistivity, 3.5 ?10-2 źcm, and an average transmittance of 85% are obtained for 200 nm thick films annealed at 450 C in air using DEA as a stabilizer.
Słowa kluczowe
Wydawca
Rocznik
Strony
201--209
Opis fizyczny
Bibliogr. 19 poz.
Twórcy
autor
  • Department of Electronic Science, University of Delhi South Campus, New Delhi 110021, India
autor
  • Department of Electronic Science, University of Delhi South Campus, New Delhi 110021, India
autor
  • Department of Electronic Science, University of Delhi South Campus, New Delhi 110021, India
Bibliografia
  • [1] PARAGUAY F.,MIKI-YOSHIDA M., SOLIS J., ESTRADA W., Thin Solid Films, 373 (2000), 137.
  • [2] HARTNAGEL H.L., DAWER A. L., JAIN A. K., JAGADISH C., Semiconducting Transparent Thin Films, Institute of Physics, Bristol, 1995.
  • [3] COUTTS T.J., YOUNG D.L., LI X., MRS Bull., 25 (2000), 56.
  • [4] HU J., GORDON R. G., J. Appl. Phys., 71 (1992), 880.
  • [5] CHANG J.F., LIN W.C., HON M.H., Appl. Surface Sci., 183 (2001), 18.
  • [6] MINAMI T., SATO H., NANTO H., TAKATA S., Jpn. J. Appl. Phys., 24 (1985) L 781.
  • [7] TANG W., CAMERON D.C., Thin Solid Films, 238 (1994), 83.
  • [8] MINAMI T., YAMAMOTO T.,MIYATA T., Thin Solid Films, 366 (2000), 63.
  • [9] MINAMI T., SATO H., TAKATA S., OGAWA N.,MOURI T., Jpn. J. Appl. Phys., 31 (1992), L 1106.
  • [10] NAKADA T., OHKUBO Y., KUNIOKA A., Jpn. J. Appl. Phys., 30 (1991), 3344.
  • [11] GROENEN R., LOFFLER J., SOMMELING P. M., LINDEN J. L., HAMERS E.A.G., SCHROPP R.E.I, VAN DE SANDEN M.C.M., Thin Solid Films, 392 (2001), 226.
  • [12] GOYAL D., SOLANKI P.,MARANTHA B., TAKWALE M., BHIDE V., Jpn. J. Appl. Phys., 31 (1992), 361.
  • [13] HIRAMATSU M., IMAEDA K., HORIO N., NAWATA N., J. Vac. Sci. Techn., A16 (1998) 669.
  • [14] SINGH A. V.,MEHRA R. M.., YOSHIDA A.,WAKAHARA A., J. Appl. Phys., 90 (2001) 5661.
  • [15] TSUCHIYA T., EMOTO T., SEI T., J. Non-Cryst. Solids, 178 (1994), 327.
  • [16] ZNAIDI L., SOLER ILLIA G.J.A.A., BENYAHIA S., SANCHEZ C, KANAEV A.V., Thin Solid Films, 428 (2003), 257.
  • [17] TAKADA S., J. Appl. Sci., 73 (1993), 4739.
  • [18] AZAROFF L.V., Elements of X-Ray Crystallography, McGraw Hill, New York, 1968, p. 552.
  • [19] VAN HEERDEN J.L., SWANEPOEL R., Thin Solid Films, 299 (1997), 72.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW7-0003-0020
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.