Application of image analysis for characterization of powders

• Autorzy: Michalski J. , Wejrzanowski T. , Pielaszek R. , Konopka K. , Łojkowski W. , Kurzydłowski K. J.
• Konferencja: Sol-Gel Materials Research, Technology, Applications SGM'04, 6-11 june 2004
• Języki publikacji: EN

Abstrakty

EN

A number of currently developed and produced modern multi-functional materials are to a large extent based on the use of powders. Powders with precisely characterized size, size distribution, shape and surface are used directly (e.g. catalysis) or to fabricate novel ceramics, metals and composites. Description of morphology of powders, both in micro- and nano-scale, could be obtained by the means of modern stereological methods supported by computerized image analysis. These methods can be used to describe size, shape, surface topography for both the aggregates and agglomerates and single crystallites. Stereological methods supported by computerized image analysis of high-resolution electron microscope images are becoming an important tool of modern powder-related materials science. The present work demonstrates the possibility of using such methods in determining the basic stereological parameters characterizing the morphology of the ceramic powders in micro- and nano-scale.

Słowa kluczowe

EN

nanocrystals; grain size and shape; image analysis; stereology

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2005
• Tom: Vol. 23, No. 1
• Strony: 79--86
• Opis fizyczny: Bibliogr. 4 poz.

Twórcy

autor

Michalski J.

• Warsaw University of Technology, Faculty of Materials Science and Engineering, Wołoska 141, 02-507 Warsaw, Poland

autor

Wejrzanowski T.

• Warsaw University of Technology, Faculty of Materials Science and Engineering, Wołoska 141, 02-507 Warsaw, Poland

autor

Pielaszek R.

• High Pressure Research Center of the Polish Academy of Science, Sokołowska 29, 01-142 Warsaw, Poland

autor

Konopka K.

• Warsaw University of Technology, Faculty of Materials Science and Engineering, Wołoska 141, 02-507 Warsaw, Poland

autor

Łojkowski W.

• High Pressure Research Center of the Polish Academy of Science, Sokołowska 29, 01-142 Warsaw, Poland

autor

Kurzydłowski K. J.

• Warsaw University of Technology, Faculty of Materials Science and Engineering, Wołoska 141, 02-507 Warsaw, Poland

Bibliografia

• [1] PIELASZEK R., Analytical expression for diffraction line profile for polydispersive powders, Appl. Crystallography, Proceedings of the XIX Conference, Kraków, Poland, September 2003, pp. 43–50.
• [2] PIELASZEK R., J. Alloys Comp. 382 (2004), 128.
• [3] KURZYDŁOWSKI K.J., RALPH B., Quantitave description of the microstructure of materials, CRC Press, Baton Rouge, USA, 1995.
• [4] WEJRZANOWSKI T., Computer assisted analysis of gradient materials microstructure, Master Thesis, Warsaw University of Technology, 2000.