Contribution to failure description as the phenomena

• Autorzy: Valis D. , Bartlett M.L.
• Języki publikacji: EN

Abstrakty

EN

We frequently work with the events' description besides other assessments in safety/risk assessment. In pure technical applications these events are related with the failure occurrence of equipment, a device, a system or an item. This contribution can be a complex problem for the term "failure" and its related characteristics. In this paper there are mentioned functions of an object and their description, classification of failures, main characteristics of failure, possible causes of failure, mechanisms of failure and consequences of failure and also other contributions related with failure very closely.

Słowa kluczowe

EN

risk; safety and dependability terminology; failure

• Wydawca: Wydawnictwo Instytutu Technicznego Wojsk Lotniczych
• Czasopismo: Journal of KONBiN
• Rocznik: 2008
• Tom: No. 4 (7)
• Strony: 211--222
• Opis fizyczny: Bibliogr. 8 poz.

Twórcy

autor

Valis D.

autor

Bartlett M.L.

• University of Defence, Faculty of Military Technologies Universita obrany, fakulta vojenských technologií 612 00 Brno, Czech Republic

Bibliografia

• 1. BLISHKE, W. R.: Reliability: Modelling, Prediction, and Optimisation. John Willey, New York, 2000.
• 2. ELSAYED, A. E.: Reliability Engineering. Addison-Wesley, New York, 1996.
• 3. MEEKER, W. Q., LUIS, A. E.: Statistical Methods for Reliability Data. John Willey, New York, 1998.
• 4. MODARES, M., KAMINSKYI, M., KRIVTSOV, V.: Reliability Engineering and Risk Analysis. A Practical Guide. Marcel Dekker, New York, 1999.
• 5. EPRD-97 Electronic Part Reliability Data. IIT Research Institute – Reliability Analysis Center. Rome, New York, 1999.
• 6. NPRD-95 Non-electronic Part Reliability Data. IIT Research Institute – Reliability Analysis Center. Rome, New York. 1999.
• 7. FMD-97 Failure Mode/Mechanism Distributions. IIT Research Institute – Reliability Analysis Center. Rome, New York. 1999.
• 8. SPIDR 2007 System and Part Integrated Data Resource. Alion Science and Technology and System Reliability Center.