Using place invariants to isolate faults in concurrent systems

• Autorzy: Tabakow I.
• Języki publikacji: EN

Abstrakty

EN

A method of fault isolation in a given concurrent system is presented. First, the system considered is modelled by a live and bounded place-transition Petri net. Then the corresponding net place invariants are computed. The system k-distinguishability measure is obtained in an unique way from the place-invariant matrix. For a large value of k, the system model is extended by using some set of additional places called test points. This is in accordance with the practical requirements introduced. To obtain an 1-distinguishable net the notion of a marked graph component is used. Next, two different diagnosis test strategies are discussed, i.e., combinational and sequential fault diagnosis (assuming MTBF -> infinity and MTTR -> 0, respectively). The approach proposed can be extended for higher level Petri nets, e.g., such as coloured nets or also to design self-diagnosable circuit realisations of Boolean interpreted Petri nets. Several examples are given.

Słowa kluczowe

EN

concurrency control; Petri nets; invariance; matrix algebra; computational complexity; functions; set theory; Boolean algebra; probability; algorithms

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Systems Science
• Rocznik: 2003
• Tom: Vol. 29, nr 4
• Strony: 99--112
• Opis fizyczny: Bibliogr. 12 poz.,

Twórcy

autor

Tabakow I.

• Computer Science Department, Wroclaw Univ. of Technology, 50-370 Wroclaw, Poland

Bibliografia

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• [9] Tabakow I.G., Using Petri net invariants in system diagnosis, Petri Net Newsletter 58, Germany, 2000, 21-31.
• [10] Tabakow I.G., An introduction to the place-transition nets k-distinguishability. Concurrency, Specification and Programming, Workshop, Vol. 2, Humboldt-Universitiit zu Berlin, Germany, 2002, 355-369.
• [11] Tabakow I.G., Using Test Points to Improve the Place -Transition Net k-Distinguisliability, Proc. of the 7th World Multiconference on Systemics, Cybernetics and Informatics SCI 2003, Orlando, Florida USA, July 27-30, Vol. IX: Computer Science and Engineering II, 2003, 173-178. Also in: 5th Polish Conference on Knowledge Engineering and Expert Systems, Ofic. Wyd. TU Wroclaw, Vol. 2, Wroclaw 2003, 149-159.
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