Model examination of the crossover effect in two-layer light-sensitive system

• Autorzy: Latacz L. , Nowak P.
• Języki publikacji: EN

Abstrakty

EN

The results of computer simulation of the effect of light scattering in a system composed of two heterogenic light-sensitive layers coated on two sides of a transparent base are presented. It has been assumed that the modelled system is irradiated with a directed X-ray beam, while the photographic effect is caused only by the light emitted by the fluorescent screens adjacent to the light-sensitive layers and containing phosphors fluorescing due to X-ray irradiation. The scattered light transpassing the base reaches the opposite light sensitive layer, thus damaging the sharpness of the details. This effect called crossover is disadvantageous in roentgenography. The qualitative dependence of the modulation transfer function of the system on both its geometric and optical parameters was examined. It has been shown that worsening of the image is the stronger the thinner the light-sensitive layers and the weaker the light scattering by single silver halide crystals. This result is surprising since in the case of single-layer light-sensitive systems not suffering from the crossover effect opposite effects are observed.

Słowa kluczowe

EN

fluorescence; light scattering; optical images; optical materials; phosphor; photographic emulsions; photographic material sensitivity; photoluminescence; radiography; silver compounds; x-ray effects

PL

fluorescencja; obraz optyczny; fotoluminescencja; radiografia; efekt promieniowania X; fotograficzne materiały światłoczułe; emulsja fotograficzna

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2001
• Tom: Vol. 31, nr 1
• Strony: 177--184
• Opis fizyczny: bibliogr. 14 poz.

Twórcy

autor

Latacz L.

autor

Nowak P.

• Politechnika Wrocławska, Instytut Chemii Fizycznej i Teoretycznej, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław