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Spectroscopic properties of encapsulated porous silicon (PS) have been studied in detail. In order to investigate different heterostructures of porous silicon a complex of analysis methods such as photoluminescence (PL) electroluminescence (EL), cathodoluminescence (CL) and thermostimulated depolarisation (TSD) were applied. The process of light emission shows a tendency to decrease. This decrease varies for different kinds of luminescence. The EL intensity dynamics depends on polarization effects in porous silicon.
Czasopismo
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Tom
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641--646
Opis fizyczny
Bibliogr. 4 poz., rys. 4
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autor
autor
- Department of Physics, Ivan Franko Lviv State University, 50 Dragomanov Str., 79005, Lviv, Ukraine.
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Typ dokumentu
Bibliografia
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bwmeta1.element.baztech-article-BPW3-0008-0029