Material relations for malism for the polar Kerr-effect multifilm and bulk systems at oblique incidence.

• Autorzy: Cojocaru E.
• Języki publikacji: EN

Abstrakty

EN

A simplified matricial formalism for the polar Kerr-effect multifilm and bulk systems at oblique incidence is presented. Overall 4x4 characteristic matrices are determined for multifilms comprising both dielectric and magnetooptic thin layers having their boundaries placed into the ambient isotropic medium. Then 2x2 extended Jones reflection matrices are obtained for polar Kerr-effect multifilm and bulk systems. Numerical examples of Kerr rotation angle and figure of merit function variations against the incident angle are given comparatively for p-and s-polarized incident light.

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 1999
• Tom: Vol. 29, nr 4
• Strony: 601--610
• Opis fizyczny: Bibliogr. 17 poz. rys. 2

Twórcy

autor

Cojocaru E.

• Department of Lasers, National Institute of Laser, Plasma and Radiation Physics, P.O. Box Mg-36, Bucharest-Magurele, R-76900 Romania.