Diagnosis of analog electronic circuits using modified oscillation - test method

• Autorzy: Toczek W.
• Konferencja: 19th IMEKO TC-10 International Conference on Technical Diagnostics. Integration in Technical Diagnostics (22-24.09.1999 ; Wrocław)
• Języki publikacji: EN

Abstrakty

EN

A new test method for analog circuits based on the oscillation-test approach is presented. For fault detection purpose the circuit under test (CUT) is forced to oscillation, which parameters are monitored. Existing faults in the CUT manifest themselves as deviations of the measured diagnostic signal parameters, or result in the loss of oscillation. The novelty of presented method is a testing oscillatory circuit with automatic amplitude control. The proposed circuit enables not only frequency measurements but also examination of variations in the amplitude step response parameters: rise time and steady-state error, that indicate faulty behaviour of the CUT. Combining measurements of frequency, time and voltage result in the improved fault coverage.

Słowa kluczowe

EN

diagnosis of analog circuits; modified oscillation-test method

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Prace Naukowe Instytutu Górnictwa Politechniki Wrocławskiej. Konferencje
• Rocznik: 1999
• Tom: Vol. 86, nr 24
• Strony: 237--242
• Opis fizyczny: Bibliogr. 6 poz., rys. 9, tab. 1

Twórcy

autor

Toczek W.

• Technical University of Gdańsk, ul. Narutowicza 11/12 Gdańsk, Poland