A method of concurrent diagnosis of digital/analogue systems, with application of microanalyzers and the standard test bus

• Autorzy: Kern J.
• Konferencja: 19th IMEKO TC-10 International Conference on Technical Diagnostics. Integration in Technical Diagnostics (22-24.09.1999 ; Wrocław)
• Języki publikacji: EN

Abstrakty

EN

The paper presents the method and the distributed diagnostic system for concurrent diagnosis of digital/analogue systems. According to the assumptions, the diagnostic procedure is partitioned into three consecutive procedure levels (signal acquisition level, error identification level, compliance testing level). Each level corresponds to the particular subprocedure and the different diagnostic subsystem. The signal acquisition subprocedure is performed concurrently according to the tasks of the system under diagnose, with a Diagnostic tester (DT). The reliability state of DT is independent of the reliability states of the diagnosed objects. The architecture of the Diagnostic Tester (DT) is distributed, with application of a set of microanalyser modules, integrated by the standard, JTAG serial Test Bus. The other diagnostic subprocedures are realised after tasks, finished by the System Under Diagnose (SUD), with software modules, which could be installed in the SUD controller environment. The presented pilot concurrent Diagnostic System was implemented and verified as the diagnostic tool for a digital. analogue test-measurement system.

Słowa kluczowe

EN

concurrent diagnosis; digital/analogue systems; micro-analysers

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Prace Naukowe Instytutu Górnictwa Politechniki Wrocławskiej. Konferencje
• Rocznik: 1999
• Tom: Vol. 86, nr 24
• Strony: 138--146
• Opis fizyczny: Bibliogr. 6 poz., rys. 4

Twórcy

autor

Kern J.

• Industrial Insitute of Electronics, Długa 44/50 00-241 Warszawa