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Study of copper sulfide layers on a polyamide film formed by the use of higher polythionic acids

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
CuxS layers on polyamide obtained by a sorption-diffusion method have been studied. These layers are formed when ions of higher polythionates and sulfur sorbed into polyamide react with a solution of Cu(I–II) salt. By potentiometric studies it has been determined that x varies in the interval 1< x < 2 in electrically conductive or semiconductive copper sulfide layers. The composition of the CuxS layer changes more significantly during the first 30 days in the direction of x decreasing. X-ray diffraction studies of the CuxS layers revealed six phases: with x = 2 (chalcocite), x = 1.9375 (djurleite), x = 1.75 (anilite), x = 1.12 (yarrowite), x = 1.06 (talnakhite), and x = 1 (covellite). The phase composition of the CuxS layer depends on the period of keeping in Cu(I–II) salt solution and on the sulfur concentration in the polyamide.
Wydawca
Rocznik
Strony
715--727
Opis fizyczny
Bibliogr. 38 poz., rys., tab.
Twórcy
autor
autor
  • Department of Inorganic Chemistry, Kaunas University of Technology, Radvilenu 19, LT-50254 Kaunas-9, Lithuania, Vitalijus.Janickis@ktu.lt
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW1-0022-0041
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